Mechanical properties of monolayer graphene oxide

JW Suk, RD Piner, J An, RS Ruoff - ACS nano, 2010 - ACS Publications
Mechanical properties of ultrathin membranes consisting of one layer, two overlapped
layers, and three overlapped layers of graphene oxide platelets were investigated by atomic …

[图书][B] Atomic force microscopy

P Eaton, P West - 2010 - books.google.com
Atomic force microscopy is an amazing technique that allies a versatile methodology (that
allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …

Normal and lateral force calibration techniques for AFM cantilevers

MLB Palacio, B Bhushan - Critical Reviews in Solid State and …, 2010 - Taylor & Francis
Atomic force microscopy (AFM) is a useful tool, not only for imaging but also for
quantification of normal and lateral forces exerted on the AFM tip while interacting with the …

Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

JE Sader, JA Sanelli, BD Adamson, JP Monty… - Review of Scientific …, 2012 - pubs.aip.org
for a rectangular cantilever requires measurement of the resonant frequency and quality
factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically …

The elastic modulus of Matrigel™ as determined by atomic force microscopy

SS Soofi, JA Last, SJ Liliensiek, PF Nealey… - Journal of structural …, 2009 - Elsevier
Recent studies indicate that the biophysical properties of the cellular microenvironment
strongly influence a variety of fundamental cell behaviors. The extracellular matrix's (ECM) …

A virtual instrument to standardise the calibration of atomic force microscope cantilevers

JE Sader, R Borgani, CT Gibson… - Review of Scientific …, 2016 - pubs.aip.org
Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers
using functionality built into individual instruments. This calibration is performed without …

Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization

RJ Cannara, M Eglin, RW Carpick - Review of Scientific Instruments, 2006 - pubs.aip.org
Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM).
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …

Practical implementation of dynamic methods for measuring atomic force microscope cantilever spring constants

SM Cook, TE Schäffer, KM Chynoweth… - …, 2006 - iopscience.iop.org
Measurement of atomic force microscope cantilever spring constants (k) is essential for
many of the applications of this versatile instrument. Numerous techniques to measure k …

[HTML][HTML] Quantitative force microscopy from a dynamic point of view

DB Haviland - Current Opinion in Colloid & Interface Science, 2017 - Elsevier
We discuss the physical origin and measurement of force between an atomic force
microscope tip and a soft material surface. Quasi-static and dynamic measurements are …

Interlaboratory round robin on cantilever calibration for AFM force spectroscopy

J Te Riet, AJ Katan, C Rankl, SW Stahl, AM van Buul… - Ultramicroscopy, 2011 - Elsevier
Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs)
strongly rely on accurately determined cantilever spring constants. Hence, to calibrate …