Mechanical properties of monolayer graphene oxide
JW Suk, RD Piner, J An, RS Ruoff - ACS nano, 2010 - ACS Publications
Mechanical properties of ultrathin membranes consisting of one layer, two overlapped
layers, and three overlapped layers of graphene oxide platelets were investigated by atomic …
layers, and three overlapped layers of graphene oxide platelets were investigated by atomic …
[图书][B] Atomic force microscopy
P Eaton, P West - 2010 - books.google.com
Atomic force microscopy is an amazing technique that allies a versatile methodology (that
allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …
allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …
Normal and lateral force calibration techniques for AFM cantilevers
MLB Palacio, B Bhushan - Critical Reviews in Solid State and …, 2010 - Taylor & Francis
Atomic force microscopy (AFM) is a useful tool, not only for imaging but also for
quantification of normal and lateral forces exerted on the AFM tip while interacting with the …
quantification of normal and lateral forces exerted on the AFM tip while interacting with the …
Spring constant calibration of atomic force microscope cantilevers of arbitrary shape
for a rectangular cantilever requires measurement of the resonant frequency and quality
factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically …
factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically …
The elastic modulus of Matrigel™ as determined by atomic force microscopy
SS Soofi, JA Last, SJ Liliensiek, PF Nealey… - Journal of structural …, 2009 - Elsevier
Recent studies indicate that the biophysical properties of the cellular microenvironment
strongly influence a variety of fundamental cell behaviors. The extracellular matrix's (ECM) …
strongly influence a variety of fundamental cell behaviors. The extracellular matrix's (ECM) …
A virtual instrument to standardise the calibration of atomic force microscope cantilevers
Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers
using functionality built into individual instruments. This calibration is performed without …
using functionality built into individual instruments. This calibration is performed without …
Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization
RJ Cannara, M Eglin, RW Carpick - Review of Scientific Instruments, 2006 - pubs.aip.org
Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM).
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …
Practical implementation of dynamic methods for measuring atomic force microscope cantilever spring constants
SM Cook, TE Schäffer, KM Chynoweth… - …, 2006 - iopscience.iop.org
Measurement of atomic force microscope cantilever spring constants (k) is essential for
many of the applications of this versatile instrument. Numerous techniques to measure k …
many of the applications of this versatile instrument. Numerous techniques to measure k …
[HTML][HTML] Quantitative force microscopy from a dynamic point of view
DB Haviland - Current Opinion in Colloid & Interface Science, 2017 - Elsevier
We discuss the physical origin and measurement of force between an atomic force
microscope tip and a soft material surface. Quasi-static and dynamic measurements are …
microscope tip and a soft material surface. Quasi-static and dynamic measurements are …
Interlaboratory round robin on cantilever calibration for AFM force spectroscopy
Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs)
strongly rely on accurately determined cantilever spring constants. Hence, to calibrate …
strongly rely on accurately determined cantilever spring constants. Hence, to calibrate …