In the current work a novel domain misorientation approach is introduced, which can resolve
sub-grains and dislocation cells using conventional EBSD. The measurement principle …

High angular resolution electron backscatter diffraction has been used to quantify the local
elastic field at the tip of mechanically loaded intragranular slip bands observed in situ in the …

While the grain size effect (GSE) is universally observed in polycrystalline metals and alloys,
extended dislocation pileups (DPUs) at grain boundaries (GBs) are rarely observed …

Dislocation distribution is one of the elementary factors that directly influence deformation
processes in structural components. Electron backscatter diffraction (EBSD) analysis is one …

A quantitative understanding of the effect of the spatial distribution and density of lattice
defects on the electron backscatter diffraction patterns requires careful consideration of the …

The mechanical properties of additive and traditionally manufactured alloys are largely
dependent on the characteristics and distribution of dislocation cell networks that develop …

Dislocation structures where basal and prismatic slip bands meet grain boundaries in tensile-
tested Mg with 4 wt% Al (Mg–4Al) were studied using a multiscale electron microscopy …

This paper characterizes novel “star” defects in GaN films grown with metal–organic vapor
phase deposition (MOVPE) on GaN substrates with electron channeling contrast imaging …

A proof of concept of a new method for automatic characterization of the dislocation density
from scanning electron microscopy images is presented. A series of backscattered electron …

Modern analytical tools, from microfocus X-ray diffraction (XRD) to electron microscopy-
based microtexture measurements, offer exciting possibilities of diffraction-based multiscale …