Probing surface and interface morphology with grazing incidence small angle X-ray scattering

G Renaud, R Lazzari, F Leroy - Surface Science Reports, 2009 - Elsevier
Nanoscience and nanotechnology are tremendously increasing fields of research that aim at
producing, characterizing and understanding nanoobjects and assemblies of nanoobjects …

[图书][B] High-resolution X-ray scattering: from thin films to lateral nanostructures

U Pietsch, V Holy, T Baumbach - 2004 - books.google.com
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has
grown as a result of the development of the semiconductor industry and the increasing …

Defect‐pattern‐induced fingerprints in the electron density of states of strained graphene layers: diffraction and simulation methods

TM Radchenko, VA Tatarenko, VV Lizunov… - … status solidi (b), 2019 - Wiley Online Library
The paper combines two theoretical approaches–the method of grazing dynamical
diffraction (which allows performing the nondestructive structural diagnostics of defects in …

Probing the Self‐Assembled Nanostructures of Functional Polymers with Synchrotron Grazing Incidence X‐Ray Scattering

M Ree - Macromolecular rapid communications, 2014 - Wiley Online Library
For advanced functional polymers such as biopolymers, biomimic polymers, brush polymers,
star polymers, dendritic polymers, and block copolymers, information about their surface …

Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction

T Baumbach, D Lübbert, M Gailhanou - Journal of Applied Physics, 2000 - pubs.aip.org
The surface shape and the spatial distribution of strain in GaInAs/InP multilayer gratings is
experimentally determined by combining high-resolution x-ray diffraction and grazing …

X-ray dynamical diffraction from multilayer Laue lenses with rough interfaces

H Yan - Physical Review B—Condensed Matter and Materials …, 2009 - APS
A modeling approach for x-ray dynamical diffraction from multilayer Laue lenses (MLLs) with
rough interfaces is developed. Although still based on the principle of the distorted-wave …

X-ray reflectivity of multilayers with non-continuous interfaces

D Rafaja, H Fuess, D Simek, J Kub… - Journal of Physics …, 2002 - iopscience.iop.org
X-ray specular reflectivity and diffuse scattering calculated using the traditional multilayer
model, which assumes continuous, non-intersecting interfaces, are capable of fitting the …

[图书][B] Quantum semiconductor devices and technologies

T Pearsall - 2013 - books.google.com
stacked QD structure and is useful for examining the possibility of all optical measurement of
stacked QD layers. Optical absorption spectra of self-assembled QDs has been little …

Grazing incidence diffraction by laterally patterned semiconductor nanostructures

T Baumbach, D Lübbert - Journal of Physics D: Applied Physics, 1999 - iopscience.iop.org
A theoretical study of grazing incidence diffraction by laterally patterned epitaxial
nanostructures is presented and successfully applied to experimental findings of …

3D Atomic arrangement at functional interfaces inside nanoparticles by resonant high-energy X-ray diffraction

V Petkov, B Prasai, S Shastri… - ACS Applied Materials & …, 2015 - ACS Publications
With current science and technology moving rapidly into smaller scales, nanometer-sized
materials, often referred to as NPs, are produced in increasing numbers and explored for …