Defect engineering in SiC technology for high-voltage power devices
T Kimoto, H Watanabe - Applied Physics Express, 2020 - iopscience.iop.org
Major features of silicon carbide (SiC) power devices include high blocking voltage, low on-
state loss, and fast switching, compared with those of the Si counterparts. Through recent …
state loss, and fast switching, compared with those of the Si counterparts. Through recent …
Review of silicon carbide processing for power MOSFET
C Langpoklakpam, AC Liu, KH Chu, LH Hsu, WC Lee… - Crystals, 2022 - mdpi.com
Owing to the superior properties of silicon carbide (SiC), such as higher breakdown voltage,
higher thermal conductivity, higher operating frequency, higher operating temperature, and …
higher thermal conductivity, higher operating frequency, higher operating temperature, and …
Material science and device physics in SiC technology for high-voltage power devices
T Kimoto - Japanese Journal of Applied Physics, 2015 - iopscience.iop.org
Power semiconductor devices are key components in power conversion systems. Silicon
carbide (SiC) has received increasing attention as a wide-bandgap semiconductor suitable …
carbide (SiC) has received increasing attention as a wide-bandgap semiconductor suitable …
[HTML][HTML] Silicon carbide: A unique platform for metal-oxide-semiconductor physics
A sustainable energy future requires power electronics that can enable significantly higher
efficiencies in the generation, distribution, and usage of electrical energy. Silicon carbide …
efficiencies in the generation, distribution, and usage of electrical energy. Silicon carbide …
[图书][B] Gallium nitride and silicon carbide power devices
BJ Baliga - 2016 - books.google.com
During the last 30 years, significant progress has been made to improve our understanding
of gallium nitride and silicon carbide device structures, resulting in experimental …
of gallium nitride and silicon carbide device structures, resulting in experimental …
Generation of very fast states by nitridation of the SiO2/SiC interface
H Yoshioka, T Nakamura, T Kimoto - Journal of Applied Physics, 2012 - pubs.aip.org
Fast states at SiO 2/SiC interfaces annealed in NO at 1150–1350 C have been investigated.
The response frequency of the interface states was measured by the conductance method …
The response frequency of the interface states was measured by the conductance method …
Preparation of hollow SiC spheres with biological template and research on its wave absorption properties
J Zhou, B Wei, Z Yao, H Lin, R Tan, W Chen… - Journal of Alloys and …, 2020 - Elsevier
In this work, SiO 2 was evenly coated on dry yeast as biological template by sol-gel method,
and the internal substances of yeast were removed at 700° C to obtain hollow silicon …
and the internal substances of yeast were removed at 700° C to obtain hollow silicon …
Interface Properties of 4H-SiC ( ) and ( ) MOS Structures Annealed in NO
S Nakazawa, T Okuda, J Suda… - … on Electron Devices, 2014 - ieeexplore.ieee.org
Interface properties of 4H-SiC (112̅0) and (11̅00) walls, the absence of junction FET
resistance, and the higher metal-oxide-semiconductor (MOS) structures annealed in nitric …
resistance, and the higher metal-oxide-semiconductor (MOS) structures annealed in nitric …
[HTML][HTML] High mobility 4H-SiC (0001) transistors using alkali and alkaline earth interface layers
Alkali (Rb and Cs) and alkaline earth (Ca, Sr, and Ba) elements have been investigated as
interface passivation materials for metal-oxide-semiconductor field-effect transistors …
interface passivation materials for metal-oxide-semiconductor field-effect transistors …
Improvement of both n-and p-channel mobilities in 4H-SiC MOSFETs by high-temperature N₂ annealing
K Tachiki, T Kimoto - IEEE Transactions on Electron Devices, 2020 - ieeexplore.ieee.org
Effects of high-temperature (1400° C–1600° C) N 2 annealing on the interface states of 4H-
SiC/SiO 2 and the channel mobility of 4H-SiC metal–oxide–semiconductor field-effect …
SiC/SiO 2 and the channel mobility of 4H-SiC metal–oxide–semiconductor field-effect …