Recent trends and perspectives on defect-oriented testing
Electronics employed in modern safety-critical systems require severe qualification during
the manufacturing process and in the field, to prevent fault effects from manifesting …
the manufacturing process and in the field, to prevent fault effects from manifesting …
RHS-TRNG: A resilient high-speed true random number generator based on STT-MTJ device
S Fu, T Li, C Zhang, H Li, S Ma, J Zhang… - … Transactions on Very …, 2023 - ieeexplore.ieee.org
High-quality random numbers are very critical to many fields such as cryptography, finance,
and scientific simulation, which calls for the design of reliable true random number …
and scientific simulation, which calls for the design of reliable true random number …
A robust deep learning attack immune MRAM-based physical unclonable function
The ubiquitous presence of electronic devices demands robust hardware security
mechanisms to safeguard sensitive information from threats. This paper presents a physical …
mechanisms to safeguard sensitive information from threats. This paper presents a physical …
Stt-mram stochastic and defects-aware dtco for last level cache at advanced process nodes
STT-MRAM is a promising candidate to replace SRAM in Last Level Caches (LLCs) thanks
to its high density and reduced leakage. However, write delay, write energy, defects and risk …
to its high density and reduced leakage. However, write delay, write energy, defects and risk …
Soft and Hard Error Correction Techniques in STT-MRAM
Spin-transfer torque magnetic random access memory (STT-MRAM) has emerged as a
promising alternative to conventional CMOS memory technologies. It offers non-volatility …
promising alternative to conventional CMOS memory technologies. It offers non-volatility …
Spin Transfer Torque Magnetic Random-access Memory with Build-in-Self-Trimming After-Test Writing Strategy
S Liu, H Cai - IEEE Transactions on Magnetics, 2023 - ieeexplore.ieee.org
A built-in-self-trimming after test (BIST-AT) write strategy for spin-transfer torque magnetic
random access memory (STT-MRAM) is proposed in this work, which aims to reduce the …
random access memory (STT-MRAM) is proposed in this work, which aims to reduce the …
Reordering method of test set based on vector eigenvalues using critical area estimation
W Zhan, L Zhang - Integration, 2024 - Elsevier
With the continuous shrinkage of integrated circuit feature sizes, circuit design has become
increasingly complex, leading to issues such as rising test complexity and inefficiency. A …
increasingly complex, leading to issues such as rising test complexity and inefficiency. A …
Variability and self-heating analysis of spin transfer torque magnetic random access memory devices
S Bejoy - 2023 - lib.buet.ac.bd
Spin Transfer Torque Magnetic Random-Access Memories (STT-MRAMs) are promising
candidates for next-generation data storage due to their non-volatility, fast access times …
candidates for next-generation data storage due to their non-volatility, fast access times …
[PDF][PDF] Testing of Interconnect and Contact Defects in STT-MRAMs
Z Zhang - 2022 - repository.tudelft.nl
Spin-transfer-torque magnetic random access memory (STT-MRAM) is regarded as one of
the most promising non-volatile memory (NVM) technologies, which has the potential to …
the most promising non-volatile memory (NVM) technologies, which has the potential to …
[PDF][PDF] TEZĂ DE DOCTORAT–REZUMAT–
EM ȘTEȚCO, OA POP - doctorat.utcluj.ro
În contextul socio-ecologic actual există o cerere din ce în ce mai mare pentru stocarea
eficientă a datelor și procesarea rapidă a informațiilor combinată cu necesitatea unui …
eficientă a datelor și procesarea rapidă a informațiilor combinată cu necesitatea unui …