Recent trends and perspectives on defect-oriented testing

P Bernardi, R Cantoro, A Coyette… - 2022 IEEE 28th …, 2022 - ieeexplore.ieee.org
Electronics employed in modern safety-critical systems require severe qualification during
the manufacturing process and in the field, to prevent fault effects from manifesting …

RHS-TRNG: A resilient high-speed true random number generator based on STT-MTJ device

S Fu, T Li, C Zhang, H Li, S Ma, J Zhang… - … Transactions on Very …, 2023 - ieeexplore.ieee.org
High-quality random numbers are very critical to many fields such as cryptography, finance,
and scientific simulation, which calls for the design of reliable true random number …

A robust deep learning attack immune MRAM-based physical unclonable function

MJ Adel, MH Rezayati, MH Moaiyeri, A Amirany… - Scientific Reports, 2024 - nature.com
The ubiquitous presence of electronic devices demands robust hardware security
mechanisms to safeguard sensitive information from threats. This paper presents a physical …

Stt-mram stochastic and defects-aware dtco for last level cache at advanced process nodes

F García-Redondo, S Rao, M Gupta… - … 2023-IEEE 53rd …, 2023 - ieeexplore.ieee.org
STT-MRAM is a promising candidate to replace SRAM in Last Level Caches (LLCs) thanks
to its high density and reduced leakage. However, write delay, write energy, defects and risk …

Soft and Hard Error Correction Techniques in STT-MRAM

S Hemaram, MB Tahoori, F Catthoor, S Rao… - IEEE Design & …, 2024 - ieeexplore.ieee.org
Spin-transfer torque magnetic random access memory (STT-MRAM) has emerged as a
promising alternative to conventional CMOS memory technologies. It offers non-volatility …

Spin Transfer Torque Magnetic Random-access Memory with Build-in-Self-Trimming After-Test Writing Strategy

S Liu, H Cai - IEEE Transactions on Magnetics, 2023 - ieeexplore.ieee.org
A built-in-self-trimming after test (BIST-AT) write strategy for spin-transfer torque magnetic
random access memory (STT-MRAM) is proposed in this work, which aims to reduce the …

Reordering method of test set based on vector eigenvalues using critical area estimation

W Zhan, L Zhang - Integration, 2024 - Elsevier
With the continuous shrinkage of integrated circuit feature sizes, circuit design has become
increasingly complex, leading to issues such as rising test complexity and inefficiency. A …

Variability and self-heating analysis of spin transfer torque magnetic random access memory devices

S Bejoy - 2023 - lib.buet.ac.bd
Spin Transfer Torque Magnetic Random-Access Memories (STT-MRAMs) are promising
candidates for next-generation data storage due to their non-volatility, fast access times …

[PDF][PDF] Testing of Interconnect and Contact Defects in STT-MRAMs

Z Zhang - 2022 - repository.tudelft.nl
Spin-transfer-torque magnetic random access memory (STT-MRAM) is regarded as one of
the most promising non-volatile memory (NVM) technologies, which has the potential to …

[PDF][PDF] TEZĂ DE DOCTORAT–REZUMAT–

EM ȘTEȚCO, OA POP - doctorat.utcluj.ro
În contextul socio-ecologic actual există o cerere din ce în ce mai mare pentru stocarea
eficientă a datelor și procesarea rapidă a informațiilor combinată cu necesitatea unui …