Ion irradiation/implantation induced defect engineering and modification in graphene derivatives-based nanocomposites: Energy storage/conversion and sensor

S Kalia, R Kumar, R Dhiman, RK Singh - Journal of Energy Storage, 2024 - Elsevier
A few decades ago, the irradiation process was considered to be just a lethal technique that
damaged the structure of solid materials, but in the last few years, new discoveries have also …

Electrically driven mid-submicrometre pixelation of InGaN micro-light-emitting diode displays for augmented-reality glasses

J Park, JH Choi, K Kong, JH Han, JH Park, N Kim… - Nature …, 2021 - nature.com
Abstracte InGaN-based blue light-emitting diodes (LEDs), with their high efficiency and
brightness, are entering the display industry. However, a significant gap remains between …

Nanoscale transport properties at silicon carbide interfaces

F Roccaforte, F Giannazzo… - Journal of Physics D …, 2010 - iopscience.iop.org
Wide bandgap semiconductors promise devices with performances not achievable using
silicon technology. Among them, silicon carbide (SiC) is considered the top-notch material …

Effects of ion implantation process on defect distribution in SiC SJ-MOSFET

T Fukui, T Ishii, T Tawara, K Takenaka… - Japanese Journal of …, 2023 - iopscience.iop.org
A superjunction (SJ) structure in power devices is compatible with low specific on-resistance
and high breakdown voltage. To fabricate the SJ structure in SiC power devices, the …

Defects related to electrical doping of 4H-SiC by ion implantation

R Nipoti, HM Ayedh, BG Svensson - Materials Science in Semiconductor …, 2018 - Elsevier
This study resumes the status of our knowledge about the formation of extended and
intrinsic defects in ion implanted 4H-SiC homo-epitaxial wafers during a high temperature …

Study of damage in ion-irradiated α-SiC by optical spectroscopy

S Sorieul, JM Costantini, L Gosmain… - Journal of Physics …, 2006 - iopscience.iop.org
UV–visible absorption and Raman scattering spectroscopy were used to investigate the
effects of 4 MeV Xe-ion and 4 MeV Au-ion irradiations on α-SiC single crystals. The …

Ionization-induced thermally activated defect-annealing process in SiC

A Debelle, L Thomé, I Monnet, F Garrido… - Physical Review …, 2019 - APS
Ionizing events can lead to panoply of irradiation effects, and in silicon carbide (SiC), they
drastically modify the defect production rate or the initial density. To better understand this …

Non-monotonic temperature dependence of radiation defect dynamics in silicon carbide

LB Bayu Aji, JB Wallace, L Shao, SO Kucheyev - Scientific Reports, 2016 - nature.com
Understanding response of solids to particle irradiation remains a major materials physics
challenge. This applies even to SiC, which is a prototypical nuclear ceramic and wide-band …

[HTML][HTML] Time constant of defect relaxation in ion-irradiated 3C-SiC

JB Wallace, LB Bayu Aji, L Shao… - Applied Physics …, 2015 - pubs.aip.org
Above room temperature, the buildup of radiation damage in SiC is a dynamic process
governed by the mobility and interaction of ballistically generated point defects. Here, we …

The damage investigations of 4H–SiC after P-ion irradiation

J Zhao, L Ye, X Jiao, Q Yue, Y Liu - Applied Physics A, 2020 - Springer
In this work, a single crystal of 4H–SiC was subjected to phosphorus irradiation at 100 keV
with four different fluences at room temperature (RT) and post-irradiation annealing …