Ion irradiation/implantation induced defect engineering and modification in graphene derivatives-based nanocomposites: Energy storage/conversion and sensor
A few decades ago, the irradiation process was considered to be just a lethal technique that
damaged the structure of solid materials, but in the last few years, new discoveries have also …
damaged the structure of solid materials, but in the last few years, new discoveries have also …
Electrically driven mid-submicrometre pixelation of InGaN micro-light-emitting diode displays for augmented-reality glasses
J Park, JH Choi, K Kong, JH Han, JH Park, N Kim… - Nature …, 2021 - nature.com
Abstracte InGaN-based blue light-emitting diodes (LEDs), with their high efficiency and
brightness, are entering the display industry. However, a significant gap remains between …
brightness, are entering the display industry. However, a significant gap remains between …
Nanoscale transport properties at silicon carbide interfaces
F Roccaforte, F Giannazzo… - Journal of Physics D …, 2010 - iopscience.iop.org
Wide bandgap semiconductors promise devices with performances not achievable using
silicon technology. Among them, silicon carbide (SiC) is considered the top-notch material …
silicon technology. Among them, silicon carbide (SiC) is considered the top-notch material …
Effects of ion implantation process on defect distribution in SiC SJ-MOSFET
T Fukui, T Ishii, T Tawara, K Takenaka… - Japanese Journal of …, 2023 - iopscience.iop.org
A superjunction (SJ) structure in power devices is compatible with low specific on-resistance
and high breakdown voltage. To fabricate the SJ structure in SiC power devices, the …
and high breakdown voltage. To fabricate the SJ structure in SiC power devices, the …
Defects related to electrical doping of 4H-SiC by ion implantation
This study resumes the status of our knowledge about the formation of extended and
intrinsic defects in ion implanted 4H-SiC homo-epitaxial wafers during a high temperature …
intrinsic defects in ion implanted 4H-SiC homo-epitaxial wafers during a high temperature …
Study of damage in ion-irradiated α-SiC by optical spectroscopy
S Sorieul, JM Costantini, L Gosmain… - Journal of Physics …, 2006 - iopscience.iop.org
UV–visible absorption and Raman scattering spectroscopy were used to investigate the
effects of 4 MeV Xe-ion and 4 MeV Au-ion irradiations on α-SiC single crystals. The …
effects of 4 MeV Xe-ion and 4 MeV Au-ion irradiations on α-SiC single crystals. The …
Ionization-induced thermally activated defect-annealing process in SiC
Ionizing events can lead to panoply of irradiation effects, and in silicon carbide (SiC), they
drastically modify the defect production rate or the initial density. To better understand this …
drastically modify the defect production rate or the initial density. To better understand this …
Non-monotonic temperature dependence of radiation defect dynamics in silicon carbide
Understanding response of solids to particle irradiation remains a major materials physics
challenge. This applies even to SiC, which is a prototypical nuclear ceramic and wide-band …
challenge. This applies even to SiC, which is a prototypical nuclear ceramic and wide-band …
[HTML][HTML] Time constant of defect relaxation in ion-irradiated 3C-SiC
JB Wallace, LB Bayu Aji, L Shao… - Applied Physics …, 2015 - pubs.aip.org
Above room temperature, the buildup of radiation damage in SiC is a dynamic process
governed by the mobility and interaction of ballistically generated point defects. Here, we …
governed by the mobility and interaction of ballistically generated point defects. Here, we …
The damage investigations of 4H–SiC after P-ion irradiation
J Zhao, L Ye, X Jiao, Q Yue, Y Liu - Applied Physics A, 2020 - Springer
In this work, a single crystal of 4H–SiC was subjected to phosphorus irradiation at 100 keV
with four different fluences at room temperature (RT) and post-irradiation annealing …
with four different fluences at room temperature (RT) and post-irradiation annealing …