As technology feature size decreases, single event upset (SEU), and single event transient
(SET) dominate the radiation response of microcircuits. Multiple bit upset (MBU)(or multi cell …

As a result of increased interest in space applications, radiation-aware circuit design has
become a major concern to guarantee the safe operation of electronic systems operating …

Soft errors, due to cosmic radiations, are one of the major challenges for reliable VLSI
designs. In this paper, we present a symbolic framework to model soft errors in both …

Abstract Analysis of Single Event Transient (SET) effects is an important step in the design of
radiation-hardened integrated circuits for space missions. Because the simulation of SET …

With the downscaling of CMOS technologies, the radiation-induced Single Event Transient
(SET) effects in combinational logic have become a critical reliability issue for modern …

Since there are many uncertain factors in the generation and propagation of single event
transient (SET), it is a very important issue that how to quantify the impact of these uncertain …

Soft errors have become one of the most challenging issues that impact the reliability of
modern microelectronic systems at terrestrial altitudes. A new methodology to abstract …

Due to shrinking feature sizes and significant reduction in noise margins, as CMOS
technologies evolve toward ultra-deep sub-micron, digital circuits have become more …

In triple-well PMOSFET transistor, a deep n+ well (DNW) is a process used to isolate the
substrate noise, which can lead to changes in effect of single event transient (SET). In outer …

This work introduces a framework for the gate-level characterization and modeling of Single
Event Transient (SET) generation and propagation effects in CMOS standard combinational …