Comparison of IGBT junction temperature measurement and estimation methods-a review
Recent growth of power semiconductor device market has been driven largely by the
growing demand for an efficient way to convert and distribute energy in the field of …
growing demand for an efficient way to convert and distribute energy in the field of …
Turn-on Delay Based Real-Time Junction Temperature Measurement for SiC MOSFETs With Aging Compensation
Online junction temperature (T j) measurement enables robust power converter operations
by providing overtemperature protection and condition monitoring of the power devices. For …
by providing overtemperature protection and condition monitoring of the power devices. For …
Evaluation of Aging's Effect on Temperature-Sensitive Electrical Parameters in SiC mosfets
The temperature-sensitive electrical parameters (TSEPs) have been used in silicon carbide
(SiC) MOSFETS junction temperature measurement for over-temperature protection and …
(SiC) MOSFETS junction temperature measurement for over-temperature protection and …
A novel converter-level IGBT junction temperature estimation method based on the bus voltage ringing
Y Yang, P Zhang - IEEE Transactions on Power Electronics, 2021 - ieeexplore.ieee.org
Insulated gate bipolar transistor (IGBT) junction temperature monitoring is crucial for
converter's healthy management and condition monitoring. However, most conventional …
converter's healthy management and condition monitoring. However, most conventional …
Junction Temperature Extraction for Silicon Carbide Power Devices: A Comprehensive Review
H Wen, X Li, F Zhang, Z Qu, Y Jiang… - … on Power Electronics, 2024 - ieeexplore.ieee.org
The complete replacement of silicon devices with silicon carbide (SiC) devices still faces
many reliability challenges considering higher cost, higher junction temperature, and its …
many reliability challenges considering higher cost, higher junction temperature, and its …
Prethreshold voltage as a low-component count temperature sensitive electrical parameter without self-heating
R Mandeya, C Chen, V Pickert… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Temperature sensitive electrical parameters (TSEPs) are promising for measurement of the
insulated gate bipolar transistor (IGBT) junction temperature. Many TSEPs have been …
insulated gate bipolar transistor (IGBT) junction temperature. Many TSEPs have been …
AC power cycling test setup and condition monitoring tools for SiC-based traction inverters
M Farhadi, BT Vankayalapati… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
AC power cycling tests allow the most realistic reliability assessment by applying close to
real stress to the device or module under test to meet functional safety standards, which is …
real stress to the device or module under test to meet functional safety standards, which is …
In Situ Insulated Gate Bipolar Transistor Junction Temperature Estimation Method via a Bond Wire Degradation Independent Parameter Turn-OFF Vce Overshoot
Y Yang, P Zhang - IEEE Transactions on Industrial Electronics, 2020 - ieeexplore.ieee.org
Fast and accurate online monitoring of junction temperature of insulated gate bipolar
transistor (IGBT) chips is of great significance for overtemperature protection and thermal …
transistor (IGBT) chips is of great significance for overtemperature protection and thermal …
A novel junction temperature estimation method independent of bond wire degradation for IGBT
Y Yang, X Ding, P Zhang - IEEE Transactions on Power …, 2023 - ieeexplore.ieee.org
The insulated-gate bipolar transistor (IGBT) junction temperature is crucial for condition
monitoring, reliability assessment, and health management. However, the existing IGBT …
monitoring, reliability assessment, and health management. However, the existing IGBT …
IGBT junction temperature estimation using a dynamic TSEP independent of wire bonding faults
Despite that many temperature-sensitive electrical parameters (TSEPs) have been
discovered for the online estimation of the junction temperature of IGBT devices, their wide …
discovered for the online estimation of the junction temperature of IGBT devices, their wide …