Reliability forecasting and Accelerated Lifetime Testing in advanced CMOS technologies
K Singh, S Kalra - Microelectronics Reliability, 2023 - Elsevier
This study harnesses a machine learning approach to precisely forecast the reliability of 22
nm Bulk Complementary Metal Oxide Transistor (CMOS) and 22 nm Metal Gate High-k …
nm Bulk Complementary Metal Oxide Transistor (CMOS) and 22 nm Metal Gate High-k …
Accurate calculation of unreliability of cmos logic cells and circuits
A Beg - Journal of Circuits, Systems and Computers, 2020 - World Scientific
Modern decananometer-sized MOS transistors tend to exhibit high rates of failure,
underscoring the need for accurately estimating the unreliabilities of circuits built from such …
underscoring the need for accurately estimating the unreliabilities of circuits built from such …