A survey on machine and deep learning in semiconductor industry: methods, opportunities, and challenges
AC Huang, SH Meng, TJ Huang - Cluster Computing, 2023 - Springer
The technology of big data analysis and artificial intelligence deep learning has been
actively cross-combined with various fields to increase the effect of its original low single …
actively cross-combined with various fields to increase the effect of its original low single …
CNN and ensemble learning based wafer map failure pattern recognition based on local property based features
The combination of feature extraction and classification methods is an often used approach
for wafer map failure pattern recognition. Recently, the convolutional neural network (CNN) …
for wafer map failure pattern recognition. Recently, the convolutional neural network (CNN) …
Fault diagnosis of rolling bearings under variable conditions based on unsupervised domain adaptation method
The paper proposes an unsupervised deep convolutional dynamic joint distribution domain
adaptive network model for the problem of bearing fault diagnosis under variable conditions …
adaptive network model for the problem of bearing fault diagnosis under variable conditions …
A generative adversarial networks based methodology for imbalanced multidimensional time-series augmentation of complex electromechanical systems
R Wang, T Li, Z Gao, X Yan, J Wang, Z Wang… - Applied Soft …, 2024 - Elsevier
Multidimensional monitoring time-series of complex electromechanical systems (CESs)
plays a foundational role in data-based state management, maintenance, and performance …
plays a foundational role in data-based state management, maintenance, and performance …
[HTML][HTML] Sparse deep encoded features with enhanced sinogramic red deer optimization for fault inspection in wafer maps
DA Altantawy, MA Yakout - Journal of Intelligent Manufacturing, 2024 - Springer
Due to the complexity and dynamics of the semiconductor manufacturing processes, wafer
bin maps (WBM) present various defect patterns caused by various process faults. The …
bin maps (WBM) present various defect patterns caused by various process faults. The …
Surface Defect Detection of Casting with Machined Surfaces Based on Natural Artificial Defects
Q Wang, Q Zhao, W Ge, X Tong, K Jiang… - Available at SSRN …, 2023 - papers.ssrn.com
Defect detection of the casting's surface is of great importance for its quality inspection.
There are a series of challenges of clear imaging and weak contrast between defects and …
There are a series of challenges of clear imaging and weak contrast between defects and …