Resolution of broadband transducers in acoustic microscopy of encapsulated ICs: Transducer selection

S Canumalla - IEEE Transactions on Components and …, 1999 - ieeexplore.ieee.org
The lateral resolution of broadband transducers commonly used in acoustic microscopy is
discussed in the context of selecting optimum transducers to make images for the best …

Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform

L Angrisani, L Bechou, D Dallet, P Daponte, Y Ousten - Measurement, 2002 - Elsevier
In a highly competitive market, reliable techniques for manufacturing quality control of
electronic devices are more and more demanded. In particular, scanning ultrasonic …

[PDF][PDF] Ultrasonic C-scan image processing using multilevel thresholding for damage evaluation in aircraft vertical stabilizer

A Wronkowicz, A Katunin, K Dragan - International Journal of Image …, 2015 - mecs-press.net
Following the “on condition maintenance” approach used for extending service life of an
aircraft one of the major tasks is a nondestructive testing of its critical elements. Considering …

Dry-contact technique for high-resolution ultrasonic imaging

H Tohmyoh, M Saka - IEEE transactions on ultrasonics …, 2003 - ieeexplore.ieee.org
To accomplish a high-resolution ultrasonic imaging without wetting a sample, the efficiency
of the dry-contact ultrasonic transmission is discussed. In this study, a dry-contact interface is …

A method for the automatic detection and measurement of transients. Part II: applications

L Angrisani, P Daponte, M D'Apuzzo - Measurement, 1999 - Elsevier
The measurement method, presented in the first part of the paper, is here used in several
application fields. A measurement procedure, aiming at a proper utilisation of the method …

Design and performance of a thin, solid layer for high-resolution, dry-contact acoustic imaging

H Tohmyoh, M Saka - IEEE transactions on ultrasonics …, 2004 - ieeexplore.ieee.org
Compared to the usual water immersion case, more effective transmission and reception of
high-frequency ultrasound through a thin, solid layer are reported. A theoretical model is …

Localization of defects in die-attach assembly by continuous wavelet transform using scanning acoustic microscopy

L Bechou, L Angrisiani, Y Ousten, D Dallet… - Microelectronics …, 1999 - Elsevier
The main goal of this paper is to describe a new method based on Continuous Wavelet
Transform (CWT) algorithm and successfully implemented in a Scanning Acoustic …

New methods for scanning ultrasonic microscopy applications for failure analysis of microassembling technologies

L Bechou, Y Ousten, Y Danto - Proceedings of the 2001 8th …, 2001 - ieeexplore.ieee.org
Scanning acoustic microscopy (SAM) is now a common detection method which produces
high resolution images with focused ultrasonic waves ranging from 10 to 500 MHz. In this …

Scanning acoustic microscopy and shear wave imaging mode performances for failure detection in high-density microassembling technologies

Z Remili, Y Ousten, B Levrier, E Suhir… - 2015 IEEE 65th …, 2015 - ieeexplore.ieee.org
This paper reports results on application of scanning acoustic microscopy (SAM) for analysis
of high-density microassembling technologies such as BGA and TSV. We have …

Extraction of the outer edge of spot welds from the acoustic image with the aid of image processing

H Tohmyoh, M Ito, Y Hasegawa, Y Matsui - The International Journal of …, 2021 - Springer
Resistance spot welding has been widely used in the industry to join steel sheets. The area
of the spot weld is one of the important parameters because it directly relates to the strength …