Time-driven placement and/or cloning of components for an integrated circuit
Techniques that facilitate time-driven placement and/or cloning of components for an
integrated circuit are provided. In one example, a system includes an analysis component, a …
integrated circuit are provided. In one example, a system includes an analysis component, a …
Extreme cases sampling method for improved variation-aware full custom design
G Morency, DJ Oriordan, JL Sanders - US Patent 10,896,274, 2021 - Google Patents
The independent claims of this patent signify a concise description of embodiments.
Roughly described, disclosed is technology for yield improvement of an integrated circuit …
Roughly described, disclosed is technology for yield improvement of an integrated circuit …
Cell-aware defect characterization by considering inter-cell timing
R Guo, E Gizdarski, X Cai - US Patent 11,334,698, 2022 - Google Patents
Disclosed is cell-aware defect characterization by considering inter-cell timing. Also
disclosed is a method and apparatus that determines whether a defect can be detected in a …
disclosed is a method and apparatus that determines whether a defect can be detected in a …
Time-driven placement and/or cloning of components for an integrated circuit
Techniques that facilitate time-driven placement and/or cloning of components for an
integrated circuit are provided. In one example, a system includes an analysis component, a …
integrated circuit are provided. In one example, a system includes an analysis component, a …
Time-driven placement and/or cloning of components for an integrated circuit
Techniques that facilitate time-driven placement and/or cloning of components for an
integrated circuit are provided. In one example, a system includes an analysis component, a …
integrated circuit are provided. In one example, a system includes an analysis component, a …
Time-driven placement and/or cloning of components for an integrated circuit
Techniques that facilitate time-driven placement and/or cloning of components for an
integrated circuit are provided. In one example, a system includes an analysis component, a …
integrated circuit are provided. In one example, a system includes an analysis component, a …
Motion-based reconfigurable microelectronics system
JS Pulskamp - US Patent 11,229,125, 2022 - Google Patents
US11229125B2 - Motion-based reconfigurable microelectronics system - Google Patents
US11229125B2 - Motion-based reconfigurable microelectronics system - Google Patents …
US11229125B2 - Motion-based reconfigurable microelectronics system - Google Patents …
Time-driven placement and/or cloning of components for an integrated circuit
Techniques that facilitate time-driven placement and/or cloning of components for an
integrated circuit are provided. In one example, a system includes an analysis component, a …
integrated circuit are provided. In one example, a system includes an analysis component, a …
Inserting bypass structures at tap points to reduce latch dependency during scan testing
SM Douskey, MJ Hamilton, AR Kaufer - US Patent 9,551,747, 2017 - Google Patents
(57) ABSTRACT A method and apparatus are provided to test an integrated circuit by
identifying first and second components of an integrated circuit. The first and second …
identifying first and second components of an integrated circuit. The first and second …
Inserting bypass structures at tap points to reduce latch dependency during scan testing
SM Douskey, MJ Hamilton, AR Kaufer - US Patent 9,547,039, 2017 - Google Patents
A method and apparatus are provided to test an integrated circuit by identifying first and
second components of an integrated circuit. The first and second components may share a …
second components of an integrated circuit. The first and second components may share a …