Focused radiation beam induced thin film deposition

CH Yu, YC Chu - US Patent 9,659,768, 2017 - Google Patents
BACKGROUND The semiconductor integrated circuit (IC) industry has experienced
exponential growth. Technological advances in IC materials and design have produced …

System and method for measuring and improving overlay using electronic microscopic imaging and digital processing

CM Ho, PS Lin, VSS Pratapa, YJ Wang - US Patent 9,793,183, 2017 - Google Patents
An SEM image is acquired. The SEM image shows a metal line and a via hole disposed
above the metal line. The via hole exposes a portion of the metal line vertically aligned with …

Focused radiation beam induced deposition

HC Shih, SC Chin, YC Chu, YH Li - US Patent 9,915,866, 2018 - Google Patents
A semiconductor device fabrication method includes irradiating a first surface of a substrate
with a radiation beam. While irradiating the first surface of the substrate, a precursor gas is …

System and method for performing spin dry etching

CC Tu, CL Chen - US Patent 10,276,426, 2019 - Google Patents
2017-06-05 Assigned to TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
reassignment TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. ASSIGNMENT OF …

EUV metallic resist performance enhancement via additives

AR Zi, J Cheng, CY Chang - US Patent 11,054,742, 2021 - Google Patents
A photoresist layer is formed over a wafer. The photoresist layer includes a metallic
photoresist material and one or more additives. An extreme ultraviolet (EUV) lithography …

Semiconductor device having improved overlay shift tolerance

CH Huang, TH Wei, CS Tsai - US Patent 11,664,237, 2023 - Google Patents
An example embodiment of the present disclosure involves a method for semiconductor
device fabrication. The method comprises providing a structure that includes a conductive …

Focused radiation beam induced deposition

HC Shih, SC Chin, YC Chu, YH Li - US Patent 10,061,193, 2018 - Google Patents
A method includes loading a mask having a defect into a chamber. The defect of the mask is
repaired by forming a repair feature in a repair region of the mask. The forming the repair …

Electron beam lithography process with multiple columns

WC Wang, SJ Lin - US Patent 9,589,764, 2017 - Google Patents
BACKGROUND Semiconductor integrated circuit (IC) fabrication involves forming multiple
material layers with designed patterns on a semiconductor wafer. Those patterned material …

Data processing of electron beam lithography system

J Yang, SJ Lin, YH Huang - US Patent 10,049,851, 2018 - Google Patents
A system includes a digital pattern generator (DPG) having a plurality of pixels that are
dynamically and individually controllable; a switching device that is coupled to the DPG, the …

Layout hierachical structure defined in polar coordinate

SM Chang - US Patent 10,001,698, 2018 - Google Patents
The present disclosure provides one embodiment of an IC method that includes receiving an
IC design layout including a first main feature and a second main feature; determining that …