Evaluating the electromigration effect on mechanical performance degradation of aluminum interconnection wires: A nanoindentation test with molecular dynamics …
Electromigration (EM) is a crucial failure mode in Aluminum (Al) interconnection wires those
are widely used in high density semiconductor packaging. This study systematically …
are widely used in high density semiconductor packaging. This study systematically …
Decomposition of Dislocations in Magnesium Alloys
In this paper, molecular dynamics simulations are performed to investigate the
decomposition of ⟨ c+ a ⟩⟨ c+ a⟩ dislocations on both pyramidal-I and pyramidal-II planes …
decomposition of ⟨ c+ a ⟩⟨ c+ a⟩ dislocations on both pyramidal-I and pyramidal-II planes …
Influence of local microstructure on the dislocation transference and micro-mechanical response in metastable fcc alloy
This work underscores the effect of local microstructural configuration on the dislocation
movement and micro-mechanical behaviour in fine/ultra-fine-grained (< 2 μm), cold-rolled …
movement and micro-mechanical behaviour in fine/ultra-fine-grained (< 2 μm), cold-rolled …