Four-point measurement setup for correlative microscopy of nanowires

BC Pruchnik, JD Fidelus, E Gacka, K Kwoka… - Nanomaterials, 2023 - mdpi.com
The measurement method, which utilizes nanomanipulation of the nanowires onto a
specially prepared substrate, was presented. It introduced a four-point resistance …

Comparative analysis on resistance profiling along tapered semiconductor nanowires: multi-tip technique versus transmission line method

A Nägelein, L Liborius, M Steidl… - Journal of Physics …, 2017 - iopscience.iop.org
The detection of doping dependent values like contact-and path resistances along
nanowires (NWs) still proves to be rather challenging compared to planar structures …

Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope

A Nägelein, M Steidl, S Korte, B Voigtländer, W Prost… - Nano research, 2018 - Springer
Profiling of the electrical properties of nanowires (NWs) and NW heterocontacts with high
spatial resolution is a challenge for any application and advanced NW device development …

Assessing the insulating properties of an ultrathin SrTiO3 shell grown around GaAs nanowires with molecular beam epitaxy

N Peric, T Dursap, J Becdelievre, M Berthe… - …, 2022 - iopscience.iop.org
We have studied electronic transport in undoped GaAs/SrTiO 3 core–shell nanowires
standing on their Si substrate with two-tip scanning tunneling microscopy in ultrahigh …

A new method for fabrication and electrical characterization of nanosized molten metals

Z Liu - Nanotechnology, 2020 - iopscience.iop.org
The electric properties represent one of the most fundamental physical properties of a
material. Here, we propose a two-probe based method for the rapid electrical …