Exploring the performance of 3-D nanosheet FET in inversion and junctionless modes: Device and circuit-level analysis and comparison

VB Sreenivasulu, AK Neelam, SR Kola, J Singh… - IEEE …, 2023 - ieeexplore.ieee.org
In this article, the performance of 3-D nanosheet FET (NS-FET) in inversion (INV) and
junctionless (JL) modes is demonstrated and compared at both device and circuit levels. In …

Benchmarking of multi-bridge-channel FETs towards analog and mixed-mode circuit applications

VB Sreenivasulu, NA Kumari, L Vakkalakula… - IEEE …, 2024 - ieeexplore.ieee.org
In this study, for the very first time developing of n-and p-type 3-D single-channel (SC)
FinFET and gate-all-around (GAA) Multi-Bridge-Channel FETs (MBCFET) like nanowire FET …

Design of resistive load inverter and common source amplifier circuits using symmetric and asymmetric nanowire FETs

VB Sreenivasulu, NA Kumari, V Lokesh… - Journal of Electronic …, 2023 - Springer
In this paper, multi-channel nanowire (NW) performance is significantly improved by
symmetric and asymmetric spacer length optimization. Device performance metrics …

Nanosheet field effect transistor device and circuit aspects for future technology nodes

AS Kumar, VB Sreenivasulu, SR Chavva… - ECS Journal of Solid …, 2023 - iopscience.iop.org
Moore's law states that the technical innovations are being absorbed already. The device's
controllability has dramatically improved since moving from a straightforward MOSFET …

Spacer engineering on nanosheet FETs towards device and circuit perspective

NA Kumari, VB Sreenivasulu, J Ajayan… - ECS Journal of Solid …, 2023 - iopscience.iop.org
Abstract The Nanosheet FET (NS FET) has proven to be a potential candidate for sub-5-nm
nodes. For the first time, in this manuscript, the NS FET performance is demonstrated by …

Unveiling the self-heating and process variation reliability of a junctionless FinFET-based hydrogen gas sensor

N Gandhi, S Rathore, RK Jaisawal… - IEEE Sensors …, 2023 - ieeexplore.ieee.org
Field-effect-transistor-based sensors are essential for environmental monitoring, industrial
analyte detection, medical diagnosis, etc. This letter unveiled the process variation, self …

A breakthrough for temperature and linearity stability from device to circuit-level with 14 nm junctionless SOI FinFET: Advancing K-band LNA performance

A Khodabakhsh, M Fallahnejad, M Vadizadeh - Microelectronics Reliability, 2024 - Elsevier
SOI junctionless (JL) FinFETs are well-suited for future wireless communication systems;
however, they suffer from the self-heating effect (SHE), which diminishes performance at …

Impact of Variation in Fin Thickness and Self-Heating on the Output Characteristics of Triangular Gate FinFETs

M Hemalatha, NB Balamurugan, M Suguna, DS Kumar - Silicon, 2024 - Springer
The self-heating effect (SHE) poses a significant obstacle for ultra-scaled devices, including
Fin Field Effect Transistors (FinFETs) designed for sub-nanometer technology. This study …

Improvement of Thermal Characteristics and On-current in Vertically Stacked Nanosheet FET by Parasitic Channel Height Engineering

YS Song, H Kim, JH Kim - IEEE Access, 2024 - ieeexplore.ieee.org
For improving thermal characteristics and on-current () in vertically stacked nanosheet field-
effect transistor (NSFET), the effect of parasitic channel height () on thermal and electrical …

Gate Dielectric Engineering on 2D FETs for Continued Scaling

AS Kumar, VB Srinivasulu, KN Rao… - Journal of Physics …, 2024 - iopscience.iop.org
In the last few years, a significant interest has been shown in 2D field effect transistors (2D
FETs) as an appropriate candidate for advanced electronics devices. This study presents a …