A review of techniques for ageing detection and monitoring on embedded systems
Embedded digital devices are progressively deployed in dependable or safety-critical
systems. These devices undergo significant hardware ageing, particularly in harsh …
systems. These devices undergo significant hardware ageing, particularly in harsh …
Puf for the commons: Enhancing embedded security on the os level
P Kietzmann, TC Schmidt… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Security is essential for the Internet of Things (IoT). Cryptographic operations for
authentication and encryption commonly rely on random input of high entropy and secure …
authentication and encryption commonly rely on random input of high entropy and secure …
A zero-cost approach to detect recycled SoC chips using embedded SRAM
Considering the rapid growth of the global consumer electronics market, counterfeiting of
integrated circuits (ICs), and in particular recycling, has become a serious issue in recent …
integrated circuits (ICs), and in particular recycling, has become a serious issue in recent …
Process variation and NBTI resilient Schmitt trigger for stable and reliable circuits
Negative bias temperature instability (NBTI) is a major time-dependent reliability concern
with the pMOS transistor at elevated temperature. NBTI in pMOS is the severe dominating …
with the pMOS transistor at elevated temperature. NBTI in pMOS is the severe dominating …
STABLE: Stress-aware boolean matching to mitigate BTI-induced SNM reduction in SRAM-based FPGAs
Z Ghaderi, N Bagherzadeh… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Biased-Temperature-Instability (BTI) aging mechanism reduces Static-Noise-Margin (SNM)
of SRAM cells. This leads to a higher Soft-Error-Rate (SER), lower reliability, and lower …
of SRAM cells. This leads to a higher Soft-Error-Rate (SER), lower reliability, and lower …
SCARe: an SRAM-based countermeasure against IC recycling
With the rapid growth of the electronics market, counterfeiting of integrated circuits (ICs), in
particular IC recycling, has become a serious issue in recent years. Recycled ICs are those …
particular IC recycling, has become a serious issue in recent years. Recycled ICs are those …
Extracting voltage dependence of BTI-induced degradation without temporal factors by using BTI-sensitive and BTI-insensitive ring oscillators
R Kishida, T Asuke, J Furuta… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Measuring bias temperature instability (BTI) by ring oscillators (ROs) is frequently used.
However, the performance of a semiconductor chip is fluctuated dynamically due to bias …
However, the performance of a semiconductor chip is fluctuated dynamically due to bias …
Design of power gated SRAM cell for reducing the NBTI effect and leakage power dissipation during the hold operation
Along with the advancement of technology, Negative bias temperature instability (NBTI) has
now been considered a severe reliability threat in modern processors causing the device to …
now been considered a severe reliability threat in modern processors causing the device to …
Sizing of the CMOS 6T‐SRAM cell for NBTI ageing mitigation
This study presents a negative bias temperature instability (NBTI) mitigation design
technique for CMOS 6T‐static random access memory (6T‐SRAM) cells. The proposed …
technique for CMOS 6T‐static random access memory (6T‐SRAM) cells. The proposed …
Ageing Analysis of Embedded SRAM on a Large-Scale Testbed Using Machine Learning
Ageing detection and failure prediction are essential in many Internet of Things (IoT)
deployments, which operate huge quantities of embedded devices unattended in the field …
deployments, which operate huge quantities of embedded devices unattended in the field …