Deep learning-based asm-hemt iv parameter extraction

F Chavez, DT Davis, NC Miller… - IEEE Electron Device …, 2022 - ieeexplore.ieee.org
A fast and accurate deep learning (DL) based ASM-HEMT IV model parameter extraction is
presented for the first time. DL-based extraction starts with 120k training data-sets …

Device performance prediction of nanoscale junctionless FinFET using MISO artificial neural network

R Ghoshhajra, K Biswas, A Sarkar - Silicon, 2022 - Springer
This paper investigates the way to use Multi-layer neural network as a possible replacement
of numerical TCAD device simulation to study device characteristics using limited …

Neural network estimations of annealed and non-annealed Schottky diode characteristics at wide temperatures range

H Doğan, S Duman, Y Torun, S Akkoyun… - Materials Science in …, 2022 - Elsevier
Abstract In this study, Artificial Neural Network (ANN) model has been proposed to
characterize the annealed and the non-annealed Schottky diode from experimental data …

Artificial neural network models for metal-ferroelectric-insulator-semiconductor ferroelectric tunnel junction memristor

T Li, E Li, H Duan, Z Chu, J Wang, W Chen - Microelectronics Journal, 2024 - Elsevier
Abstract Metal-Ferroelectric-Insulator-Semiconductor (MFIS) structure ferroelectric tunnel
junction (FTJ) memristor becomes one of the most promising candidates for next-generation …

Algorithmic optimization of transistors applied to silicon LDMOS

PJ Chuang, A Saadat, ML Van De Put… - IEEE …, 2023 - ieeexplore.ieee.org
We propose a pioneering approach that integrates optimization algorithms and technology
computer-aided design to automatically optimize laterally-diffused metal-oxide …

Using U-Net convolutional neural network to model pixel-based electrostatic potential distributions in GaN power MIS-HEMTs

BR Chen, YS Hsiao, WC Lin, WJ Lee, NY Chen… - Scientific Reports, 2024 - nature.com
This study demonstrates a novel use of the U-Net convolutional neural network (CNN) for
modeling pixel-based electrostatic potential distributions in GaN metal–insulator …

Optimization of dual field plate AlGaN/GaN HEMTs using artificial neural networks and particle swarm optimization algorithm

S Liu, X Duan, S Wang, J Zhang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Field plate technology is an effective method for improving the breakdown performance of
AlGaN/GaN high electron mobility transistor (HEMT). Currently, field plate optimization relies …

Accurate Modeling for GaN HEMTs and MMICs for C ryogenic Electronics Applications Utilizing Artificial Neural Network

Z Xiang, H Zhang, B Zeng, M Zhang… - IEEE Journal of …, 2024 - ieeexplore.ieee.org
The prosperity of quantum computing has boosted the development of cryogenic electronics.
The wide bandgap GaN-based devices show the potential to develop such cryogenic …

Deep-learning Model for Buildup of Ionization Defects in Bipolar Junction Transistors

L Li, XC Chen, GX Yang - IEEE Transactions on Nuclear …, 2023 - ieeexplore.ieee.org
The ionization defects in bipolar junction transistors (BJTs) are sensitive to ionization dose
rate and molecular hydrogen in oxides. The bimolecular reaction model, a physical model …

Efficient Automatic Design of IGBT Structural Parameters Using Differential Evolution and Machine Learning Model

Q Yao, J Chen, K Yang, J Yao, J Zhang… - … on Computer-Aided …, 2024 - ieeexplore.ieee.org
Insulated gate bipolar transistors (IGBTs) are the key component in power electronics, and
the intricate relationship between their performance and structural parameters poses a …