Simple Modeling and Analysis of Total Ionizing Dose Effects on Radio-Frequency Low-Noise Amplifiers
T Kim, G Ryu, J Lee, MK Cho, DM Fleetwood… - Electronics, 2024 - mdpi.com
In this study, the degradation characteristics of radio frequency (RF)-low-noise amplifiers
(LNA) due to a total ionizing dose (TID) is investigated. As a device-under-test (DUT) …
(LNA) due to a total ionizing dose (TID) is investigated. As a device-under-test (DUT) …
185–215 GHz CMOS Frequency Doubler with a Single Row Staggered Distribution Layout Design
R Dong, C You - Electronics, 2023 - mdpi.com
This paper presents a 220 GHz× 2 amplifier–doubler chain composed of a rat-race balun, a
6-stage driver amplifier, and a frequency doubler. The presented amplifier–doubler chain …
6-stage driver amplifier, and a frequency doubler. The presented amplifier–doubler chain …