Electronics industry is one of the fastest evolving, innovative, and most competitive
industries. In order to meet the high consumption demands on electronics components …

Continued advances in machine learning (ML) and deep learning (DL) present new
opportunities for use in a wide range of applications. One prominent application of these …

Due to the high complexity and dynamics of the semiconductor manufacturing process,
various process abnormality could result in wafer map defects in many work stations. Thus …

Wafer is a thin slice of semiconductor substance used for fabricating integrated circuits in
semiconductor manufacturing. Wafer Bin Maps (WBM) are the results of Circuit Probe …

We review the broad variety of methods that have been proposed for anomaly detection in
images. Most methods found in the literature have in mind a particular application. Yet we …

A recent systematic review identified 73 empirical studies that linked human factors (HF) with
manufacturing quality. Human fatigue was noted as a frequent (n= 26) issue in the HF …

We propose a unified framework for detecting defects in planar industrial products or planar
surfaces of nonplanar products based on a template-matching strategy. The framework …

At present, inspection systems process visual data captured by cameras, with deep learning
approaches applied to detect defects. Defect detection results usually have an accuracy …

Semiconductor wafer map data provides valuable information for semiconductor engineers.
Correctly classified defect patterns in wafer maps can increase semiconductor productivity …

Computational imaging is increasingly vital for a broad spectrum of applications, ranging
from biological to material sciences. This includes applications where the object is known …