Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

A method of automatically synthesizing data paths from a behavioral description has been
developed. An initial implementation of this method, which is integrated into the Carnegie …

As predicted by technology roadmaps, embedded micro-electro-mechanical-systems
(MEMS) is yet another step in the continuous search for higher levels of integration and …

The fault injection technique is utilized for simulation-based verification of safety-related
analog and mixed-signal (AMS) circuits for compliance with safety requirements in the …

In this paper, Oscillation-based Test Methodology (OTM) is evaluated in the context of
MEMS testing. Both qualitative and quantitative evaluations of fault coverage are discussed …

High-reliability and safety-critical markets for microelectromechanical systems are driving
new proposals for the integration of efficient built-in test and monitoring functions. The …

In this article, a set membership (SM) identification technique is tailored to detect faults in
microelectromechanical systems. The SM-identifier estimates an orthotope which contains …

During their first fifty years, MEMS have been marked by long development cycles and
tremendous potential mixed with sporadic market success. Development times have been …

Microsystems are rapidly evolving from individual transducer components into highly
integrated complete systems on the same chip. Conceiving these devices requires …

The Challenger space shuttle disaster was due to failure of a solid rocket booster field joint.
The NASA management and engineering team's failed in utilizing Failure Mode & Effect …