Van der Pauw's method enables the sheet resistance R_\rmsq and the Hall mobility \rmH to
be extracted from arbitrarily shaped simply connected planar samples with four peripheral …

The dependence of cathodoluminescence (CL) on resistances in semiconductor structures,
especially on layer resistances, is described. The effect can be taken advantage of and used …

Cathodoluminescence (CL) studies are widely applied in semi‐conductor science and
technology. However, for structures with ap‐n junction the CL spatial distribution can be …

The dependence of defect detection by cathodoluminescence in a scanning electron
microscope on the electron beam current is considered. The examined specimens are …

The dependence of spatially and spectrally resolved cathodoluminescence in a scanning
electron microscope on resistances in semiconductor structures, especially on the layer …

Luminescence studies are used to investigate the local properties of various light-emitting
materials. A critical issue of these studies is presented that the signals often lack all …

Abstract [eng] The research of non-invasive method for condensate resistance measurement
uses a substrate with a single-contact area. The novelty of this measurement method lies in …

Department of Materials and Semiconductor Structures Research - Prace Instytutu
Technologii Elektronowej - Tom z. 1/2 (2011) - BazTech - Yadda PL | EN Szukaj Przeglądaj …