Ultrathin ferroic HfO2–ZrO2 superlattice gate stack for advanced transistors

SS Cheema, N Shanker, LC Wang, CH Hsu, SL Hsu… - Nature, 2022 - nature.com
With the scaling of lateral dimensions in advanced transistors, an increased gate
capacitance is desirable both to retain the control of the gate electrode over the channel and …

Emergent ferroelectricity in subnanometer binary oxide films on silicon

SS Cheema, N Shanker, SL Hsu, Y Rho, CH Hsu… - Science, 2022 - science.org
The critical size limit of voltage-switchable electric dipoles has extensive implications for
energy-efficient electronics, underlying the importance of ferroelectric order stabilized at …

Demonstration of L-shaped tunnel field-effect transistors

SW Kim, JH Kim, TJK Liu, WY Choi… - IEEE transactions on …, 2015 - ieeexplore.ieee.org
An L-shaped tunnel FET (TFET), which features band-to-band tunneling (BTBT)
perpendicular to the channel direction, is experimentally demonstrated for the first time. It is …

Injuries to the great toe

PJ York, FB Wydra, KJ Hunt - Current reviews in musculoskeletal medicine, 2017 - Springer
Purpose of review Injuries to the great toe are common in athletes. While most are managed
nonoperatively and allow return to sports activity, some great toe injuries are highly …

Extrinsic and Intrinsic Frequency Dispersion of High-k Materials in Capacitance-Voltage Measurements

J Tao, CZ Zhao, C Zhao, P Taechakumput, M Werner… - Materials, 2012 - mdpi.com
In capacitance-voltage (CV) measurements, frequency dispersion in high-k dielectrics is
often observed. The frequency dependence of the dielectric constant (k-value), that is the …

Nitric acid oxidation of Si to form ultrathin silicon dioxide layers with a low leakage current density

H Kobayashi Asuha, O Maida, M Takahashi… - Journal of Applied …, 2003 - pubs.aip.org
Ultrathin silicon dioxide (SiO 2) layers with excellent electrical characteristics can be formed
using the nitric acid oxidation of Si (NAOS) method, ie, by immersion of Si in nitric acid (HNO …

Field effect transistors with gate dielectric on Si

K Eisenbeiser, JM Finder, Z Yu, J Ramdani… - Applied Physics …, 2000 - pubs.aip.org
SrTiO 3 has been grown epitaxially by molecular beam epitaxy on Si. The capacitance of
this 110 Å dielectric film is electrically equivalent to less than 10 Å of SiO 2. This structure …

Seeding Atomic Layer Deposition of High-k Dielectrics on Epitaxial Graphene with Organic Self-Assembled Monolayers

JMP Alaboson, QH Wang, JD Emery, AL Lipson… - Acs Nano, 2011 - ACS Publications
The development of high-performance graphene-based nanoelectronics requires the
integration of ultrathin and pinhole-free high-k dielectric films with graphene at the wafer …

Engineering chemically abrupt high-k metal oxide∕ silicon interfaces using an oxygen-gettering metal overlayer

H Kim, PC McIntyre, C On Chui, KC Saraswat… - Journal of Applied …, 2004 - pubs.aip.org
High-k metal oxide gate dielectrics may be required to extend Moore's law of semiconductor
device density scaling into the future. However, growth of a thin SiO 2-containing interface …

AC-capacitance techniques for interface trap analysis in GaN-based buried-channel MIS-HEMTs

S Yang, S Liu, Y Lu, C Liu… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Effective interface trap characterization approaches are indispensable in the development of
gate stack and dielectric surface passivation technologies in III-nitride (III-N) insulated-gate …