In this review an attempt is made to delineate those physical characteristics of the sputtering
event which are of importance for the discussion of sputtered ion emission. Emphasis is …

I. INTRODUCTION A. Scope and Purpose of the Review The purpose of this paper is to
provide a brief overview and review of the role of reference materials and reference methods …

A method for quantitative analysis of silicates with an ion-microprobe has been developed
by suppressing the intensities of interfering molecular ion species based on the difference in …

Quantitative analysis in general aims at determining the value of a selected physical or
chemical property of a given sample. With SIMS, in particular, the parameters to be …

The pure element secondary ion yields under oxygen and cesium ion bombardment are
shown to be solely dependent on a) the ionization potential (or electron affinity for negative …

Analytical techniques have been developed for using a secondary ion mass spectrometer,
the ion microprobe mass analyzer (IMMA), to determine, in situ, 207 Pb 206 Pb and U/Pb …

Surface analytical techniques Including Ion microprobe mass spectrometry and Auger
electron spectrometry have been used to demonstrate elemental surface predominance In …

A number of features characteristic of different thin-film analytical methods are reviewed and
evaluated. The principles, approach for quantification and prominent problems of the most …

We have studied the static-mode ion-beam sputtering of Si+ from a Si (100) surface during
oxidation and nitridation. The data are consistent with the ionization of sputtered atoms …

Secondary ion mass spectrometry (SIMS) is a potentially valuable but not fully exploited
technique for problems in biological research. It is valuable because of:(1) detection of all …