Bulk and epitaxial growth of silicon carbide
T Kimoto - Progress in Crystal Growth and Characterization of …, 2016 - Elsevier
Silicon carbide (SiC) is a wide bandgap semiconductor having high critical electric field
strength, making it especially attractive for high-power and high-temperature devices …
strength, making it especially attractive for high-power and high-temperature devices …
Silicon carbide and its use as a radiation detector material
F Nava, G Bertuccio, A Cavallini… - … Science and Technology, 2008 - iopscience.iop.org
We present a comprehensive review of the properties of the epitaxial 4H silicon carbide
polytype (4H–SiC). Particular emphasis is placed on those aspects of this material related to …
polytype (4H–SiC). Particular emphasis is placed on those aspects of this material related to …
Anisotropic charge transport enabling high‐throughput and high‐aspect‐ratio wet etching of silicon carbide
Wet etching of silicon carbide typically exhibits poor etching efficiency and low aspect ratio.
In this study, an etching structure that exploits anisotropic charge carrier flow to enable high …
In this study, an etching structure that exploits anisotropic charge carrier flow to enable high …
Temperature-dependent short-circuit capability of silicon carbide power MOSFETs
This paper presents a comprehensive short-circuit ruggedness evaluation and numerical
investigation of up-to-date commercial silicon carbide (SiC) MOSFETs. The short-circuit …
investigation of up-to-date commercial silicon carbide (SiC) MOSFETs. The short-circuit …
Degradation of hexagonal silicon-carbide-based bipolar devices
M Skowronski, S Ha - Journal of applied physics, 2006 - pubs.aip.org
Only a few years ago, an account of degradation of silicon carbide high-voltage pin diodes
was presented at the European Conference on Silicon Carbide and Related Compounds …
was presented at the European Conference on Silicon Carbide and Related Compounds …
[图书][B] The VLSI handbook
WK Chen - 1999 - taylorfrancis.com
Over the years, the fundamentals of VLSI technology have evolved to include a wide range
of topics and a broad range of practices. To encompass such a vast amount of knowledge …
of topics and a broad range of practices. To encompass such a vast amount of knowledge …
Carrier lifetime measurement in n− 4H-SiC epilayers
PB Klein - Journal of Applied Physics, 2008 - pubs.aip.org
The effects of measurement technique and measurement conditions (eg, injection level,
temperature) on measured carrier lifetimes in n− 4H-SiC epilayers are investigated both …
temperature) on measured carrier lifetimes in n− 4H-SiC epilayers are investigated both …
Short minority carrier lifetimes in highly nitrogen-doped 4H-SiC epilayers for suppression of the stacking fault formation in PiN diodes
T Tawara, T Miyazawa, M Ryo, M Miyazato… - Journal of Applied …, 2016 - pubs.aip.org
We investigated the dependency of minority carrier lifetimes on the nitrogen concentration,
temperature, and the injected carrier concentration for highly nitrogen-doped 4H-SiC …
temperature, and the injected carrier concentration for highly nitrogen-doped 4H-SiC …
Growth of SiC by “Hot‐Wall” CVD and HTCVD
O Kordina, C Hallin, A Henry, JP Bergman… - … status solidi (b), 1997 - Wiley Online Library
A reactor concept for the growth of high‐quality epitaxial SiC films has been investigated.
The reactor concept is based on a hot‐wall type susceptor which, due to the unique design …
The reactor concept is based on a hot‐wall type susceptor which, due to the unique design …
4H–SiC photoconductive switching devices for use in high-power applications
Silicon carbide is a wide-band-gap semiconductor suitable for high-power high-voltage
devices and it has excellent properties for use in photoconductive semiconductor switches …
devices and it has excellent properties for use in photoconductive semiconductor switches …