Recent progress of GaN power devices for automotive applications
T Kachi - Japanese Journal of Applied Physics, 2014 - iopscience.iop.org
Many power switching devices are used in hybrid vehicles (HVs) and electric vehicles (EVs).
To improve the efficiency of HVs and EVs, better performance characteristics than those of Si …
To improve the efficiency of HVs and EVs, better performance characteristics than those of Si …
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives
G Meneghesso, G Verzellesi, F Danesin… - … on Device and …, 2008 - ieeexplore.ieee.org
Failure modes and mechanisms of AlGaN/GaN high-electron-mobility transistors are
reviewed. Data from three de-accelerated tests are presented, which demonstrate a close …
reviewed. Data from three de-accelerated tests are presented, which demonstrate a close …
GaN-based power devices: Physics, reliability, and perspectives
Over the last decade, gallium nitride (GaN) has emerged as an excellent material for the
fabrication of power devices. Among the semiconductors for which power devices are …
fabrication of power devices. Among the semiconductors for which power devices are …
Testing the temperature limits of GaN-based HEMT devices
D Maier, M Alomari, N Grandjean… - … on device and …, 2010 - ieeexplore.ieee.org
The high temperature stability of AlGaN/GaN and lattice-matched InAlN/GaN heterostructure
FETs has been evaluated by a stepped temperature test routine under large-signal …
FETs has been evaluated by a stepped temperature test routine under large-signal …
Extraction of dynamic on-resistance in GaN transistors: Under soft-and hard-switching conditions
B Lu, T Palacios, D Risbud, S Bahl… - 2011 IEEE Compound …, 2011 - ieeexplore.ieee.org
In this paper we present a new measurement technique for extracting dynamic on-resistance
(R dson) of GaN transistors. Dynamic R dson of commercial GaN transistors in soft-switching …
(R dson) of GaN transistors. Dynamic R dson of commercial GaN transistors in soft-switching …
An overview on analyses and suppression methods of trapping effects in AlGaN/GaN HEMTs
R Ye, X Cai, C Du, H Liu, Y Zhang, X Duan… - IEEE Access, 2021 - ieeexplore.ieee.org
Due to the excellent material characteristics, AlGaN/GaN HEMTs are widely used in high
power and high frequency applications. However, the existence of damages, defects and …
power and high frequency applications. However, the existence of damages, defects and …
Investigation of high-electric-field degradation effects in AlGaN/GaN HEMTs
M Faqir, G Verzellesi, G Meneghesso… - … on Electron Devices, 2008 - ieeexplore.ieee.org
High-electric-field degradation phenomena are investigated in GaN-capped AlGaN/GaN
HEMTs by comparing experimental data with numerical device simulations. Under power …
HEMTs by comparing experimental data with numerical device simulations. Under power …
Channel temperature determination in high-power AlGaN/GaN HFETs using electrical methods and Raman spectroscopy
RJT Simms, JW Pomeroy, MJ Uren… - … on Electron Devices, 2008 - ieeexplore.ieee.org
Self-heating in AlGaN/GaN HFETs was investigated using electrical analysis and micro-
Raman thermography. Two typically employed electrical methods were assessed to provide …
Raman thermography. Two typically employed electrical methods were assessed to provide …
Analysis of degradation mechanisms in lattice-matched InAlN/GaN high-electron-mobility transistors
J Kuzmik, G Pozzovivo, C Ostermaier… - Journal of Applied …, 2009 - pubs.aip.org
We address degradation aspects of lattice-matched unpassivated InAlN/GaN high-electron-
mobility transistors (HEMTs). Stress conditions include an off-state stress, a semi-on stress …
mobility transistors (HEMTs). Stress conditions include an off-state stress, a semi-on stress …
Mechanisms of RF current collapse in AlGaN–GaN high electron mobility transistors
M Faqir, G Verzellesi, A Chini, F Fantini… - … on Device and …, 2008 - ieeexplore.ieee.org
The physical mechanisms underlying RF current-collapse effects in AlGaN-GaN high-
electron-mobility transistors are investigated by means of measurements and numerical …
electron-mobility transistors are investigated by means of measurements and numerical …