Process variation—deviation in parameters from their nominal specifications—threatens to
slow down and even pause technological scaling, and mitigation of it is the way to continue …

Microelectronic circuits exhibit increasing variations in performance, power consumption,
and reliability parameters across the manufactured parts and across use of these parts over …

All of the theoretical speed scaling research to date has assumed that the power function,
which expresses the power consumption P as a function of the processor speed s, is of the …

Memory-based physical unclonable functions (mPUFs) are widely accepted as highly
secure because of the unclonable and immutable nature of manufacturer process variations …

Process variations will greatly impact the stability, leakage power consumption, and
performance of future microprocessors. These variations are especially detrimental to 6T …

Fueled by increasing network bandwidth and decreasing costs, the popularity of over-the-
top large-scale live video streaming has dramatically increased over the last few years. In …

Extreme technology integration in the sub-micron regime comes with a rapid rise in heat
dissipation and power density for modern processors. Dynamic voltage scaling is a widely …

Interconnect reliability has been regarded as a discipline that must be seriously taken into
account from the early design phase of integrated circuit (IC). In order to study the status and …

The inputs and clock signals combination sleep state dependent leakage current
characteristics is analyzed and the optimal sleep state is examined in sub-65nm dual Vt …

[2]. The Cell Processor from Sony, Toshiba and IBM (STI)[3], and the Sun UltraSPARC T1
(formerly codenamed Niagara)[4] signal the growing popularity of such systems …