An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools

Q Huang, J Jiang - Progress in Nuclear Energy, 2019 - Elsevier
New requirements on post-accident monitoring systems in nuclear power plants pose fresh
challenges for electronic system designers and nuclear power plant personnel, in particular …

An overview on bipolar junction transistor as a sensor for X-ray beams used in medical diagnosis

LAP Santos - Sensors, 2022 - mdpi.com
Although not manufactured to be used under X-ray photons, the commercial bipolar junction
transistor (BJT) is an electronic device that can be used as an ionizing radiation sensor. In …

Observation and Origin of Anomalous Early Recovery of Base Currents in Low-Dose-Rate γ-Ray-Irradiated PNP Transistors

G Zhang, ZH Yang, H Zhou, Y Liu, J Yang… - ACS Applied …, 2023 - ACS Publications
We observe an anomalous early recovery behavior of base currents in silicon PNP
transistors irradiated by 60Co γ-rays at a dose rate below 1 mrad (Si)/s, which, however …

ATHENA: A unique radiation environment platform at the National Ignition Facility

NJ Quartemont, G Peterson, C Moran, A Samin… - Nuclear Instruments and …, 2021 - Elsevier
This paper describes the ATHENA platform, an energy tuning assembly, which was
developed to spectrally shape the National Ignition Facility (NIF) deuterium–tritium fusion …

Current gain degradation model of displacement damage for drift BJTs

L Li, JM Shi, XQ Liu, JQ Yang, XW Wang… - … on Nuclear Science, 2019 - ieeexplore.ieee.org
Drift bipolar junction transistors (BJTs), characterized by a graded doping profile in the base
region, are susceptible to the recombination in both the base and emitter-base depletion …

Radiation response of 28 nm CMOS transistors at high proton and neutron fluences for high energy physics applications

G Termo, G Borghello, F Faccio, S Michelis… - Nuclear Instruments and …, 2024 - Elsevier
The 28 nm CMOS technology was selected as a promising candidate to upgrade electronics
of particle detectors at CERN. Despite the robustness of this node to ultra-high levels of total …

Experimental study on displacement damage effects of anode-short MOS-controlled thyristor

L Li, ZH Li, M Ren, JJ Li, GX Yang… - … on Nuclear Science, 2020 - ieeexplore.ieee.org
The metal-oxide-silicon (MOS)-controlled thyristor (MCT) has been characterized by MOS-
gating, high-current-rise rate, and high blocking capabilities. The anode-short MCT (AS …

Ionizing and non-ionizing kerma factors in silicon for China Spallation Neutron Source neutron spectrum

XM Jin, Y Liu, CL Su, W Chen, C Wang… - Nuclear Science and …, 2019 - Springer
The quantification of ionizing energy deposition and non-ionizing energy deposition plays a
critical role in precision neutron dosimetry and in the separation of the displacement …

Characterizing and modeling current gain degradation in bipolar transistor exposed to heavy ion radiation

Z Liu, Y Sun, T Wang, X Li, Y Shi - Materials Science in Semiconductor …, 2021 - Elsevier
Abstract Radiation effects of 20 MeV Br on bipolar transistors are investigated in this work. A
distinct different bias dependences are found for damage factors (DF) of forward and reverse …

Influence of Accumulated Radiation Effects on Single-event Burnout in SiC MOSFETs

L Wu, S Dong, X Xu, Y Wei, Z Liu, W Li… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
The accumulated radiation effects of preirradiation from different radiation sources on single-
event burnout (SEB) of silicon carbide metal-oxide-semiconductor field-effect transistors …