Shallow trench isolation chemical mechanical planarization: a review

R Srinivasan, PVR Dandu… - ECS Journal of Solid State …, 2015 - iopscience.iop.org
Electrical isolation of the billion or so active components in each integrated device is
achieved using shallow trench isolation (STI) which requires chemical mechanical …

[HTML][HTML] Effect of a water film on the material removal behavior of Invar during chemical mechanical polishing

W Wang, D Hua, Q Zhou, S Li, SJ Eder, J Shi… - Applied Surface …, 2023 - Elsevier
Understanding polishing mechanisms in water-lubricated environments has an important
guiding value for surface engineering of precision devices. This work reveals the chemical …

[HTML][HTML] Nanoscale tribological aspects of chemical mechanical polishing: A review

D Datta, H Rai, S Singh, M Srivastava… - Applied Surface Science …, 2022 - Elsevier
The semiconductor industry is the backbone of exponentially growing digitization. Countries
from the east and the west both are investing significantly to accelerate this growth …

High-purity nano silica powder from rice husk using a simple chemical method

R Yuvakkumar, V Elango, V Rajendran… - Journal of experimental …, 2014 - Taylor & Francis
A highly pure, small particle-sized and high surface area nano silica powder was prepared
from rice husk using alkali extraction, followed by an acid precipitation method. The …

RE (La, Nd and Yb) doped CeO2 abrasive particles for chemical mechanical polishing of dielectric materials: Experimental and computational analysis

J Cheng, S Huang, Y Li, T Wang, L Xie, X Lu - Applied Surface Science, 2020 - Elsevier
Abstract Ce 3+ in CeO 2, rather than Ce 4+, is believed to provide assistance to the breaking
up of Sisingle bondO bond during chemical mechanical polishing (CMP) of silica. In the …

Chemical effect on the material removal rate in the CMP of silicon wafers

YG Wang, LC Zhang, A Biddut - Wear, 2011 - Elsevier
This paper investigates the effects of oxidizer concentration, pH and slurry flow rate on the
material removal rate (MRR) in chemo-mechanical polishing (CMP) of Si (100) wafers. The …

Atomistic mechanisms of Si chemical mechanical polishing in aqueous H2O2: ReaxFF reactive molecular dynamics simulations

J Wen, T Ma, W Zhang, ACT van Duin, X Lu - Computational Materials …, 2017 - Elsevier
ReaxFF reactive molecular dynamics simulations are employed to study the process of the
silica abrasive particle sliding on the Si (1 0 0) substrate in the aqueous H 2 O 2 in order to …

Cerium oxide (CeO2-x) nanoparticles with high Ce3+ proportion synthesized by pulsed plasma in liquid

W Ma, T Mashimo, S Tamura, M Tokuda, S Yoda… - Ceramics …, 2020 - Elsevier
Abstract Cerium oxide (CeO 2-x) nanoparticles were synthesized using a simple one-step
method known as the pulsed plasma in liquid (PPL). XRD analysis showed the production of …

Controlling the synthesis conditions for silica nanosphere from semi-burned rice straw

MM Hessien, MM Rashad, RR Zaky… - Materials science and …, 2009 - Elsevier
Silica nanoparticles have been prepared through dissolution–precipitation process from rice
straw ash (RSA) for different electronic applications. The dissolution of silica from RSA was …

High-performance chemical mechanical polishing slurry for aluminum alloy using hybrid abrasives of zirconium phosphate and alumina

T Li, H Sun, D Wang, J Huang, D Li, F Lei, D Sun - Applied Surface Science, 2021 - Elsevier
Chemical mechanical polishing (CMP) is the most effective technology for the global and
local planarization of metal surfaces. In this study, an environment-friendly and highly …