Regulating electron diffraction direction with cylindrically symmetric rotating crystal
L Cheng, B Da, X Liu, K Shigeto, K Tsukagoshi… - arXiv preprint arXiv …, 2022 - arxiv.org
We report a promising InSiO film that allows simultaneous observation of sample
morphology and Kikuchi patterns in raster scan mode of scanning electron microscopy. This …
morphology and Kikuchi patterns in raster scan mode of scanning electron microscopy. This …