Nonthermal plasma synthesis of nanocrystals: fundamental principles, materials, and applications

UR Kortshagen, RM Sankaran, RN Pereira… - Chemical …, 2016 - ACS Publications
Nonthermal plasmas have emerged as a viable synthesis technique for nanocrystal
materials. Inherently solvent and ligand-free, nonthermal plasmas offer the ability to …

Germanium CMOS potential from material and process perspectives: Be more positive about germanium

A Toriumi, T Nishimura - Japanese Journal of Applied Physics, 2017 - iopscience.iop.org
CMOS miniaturization is now approaching the sub-10 nm level, and further downscaling is
expected. This size scaling will end sooner or later, however, because the typical size is …

High-Electron-Mobility n-MOSFETs With Two-Step Oxidation

CH Lee, T Nishimura, K Nagashio… - IEEE transactions on …, 2011 - ieeexplore.ieee.org
We propose a two-step oxidation with high-pressure oxidation and low-temperature oxygen
annealing to form ideal Ge/GeO 2 stacks based on thermodynamic and kinetic control. The …

Germanium and silicon nanocrystal thin-film field-effect transistors from solution

ZC Holman, CY Liu, UR Kortshagen - Nano Letters, 2010 - ACS Publications
Germanium and silicon have lagged behind more popular II− VI and IV− VI semiconductor
materials in the emerging field of semiconductor nanocrystal thin film devices. We report …

Relative influence of surface states and bulk impurities on the electrical properties of Ge nanowires

S Zhang, ER Hemesath, DE Perea, E Wijaya… - Nano …, 2009 - ACS Publications
We quantitatively examine the relative influence of bulk impurities and surface states on the
electrical properties of Ge nanowires with and without phosphorus (P) doping. The …

High-mobility Ge N-MOSFETs and mobility degradation mechanisms

D Kuzum, T Krishnamohan, A Nainani… - IEEE transactions on …, 2010 - ieeexplore.ieee.org
Ge N-MOSFETs have exhibited poor drive currents and low mobility, as reported by several
different research groups in the past. The major mechanisms behind poor Ge NMOS …

Hf0.5Zr0.5O2-Based Germanium Ferroelectric p-FETs for Nonvolatile Memory Applications

C Zacharaki, S Chaitoglou, N Siannas… - ACS Applied …, 2022 - ACS Publications
Ferroelectric field-effect transistors (FeFETs) with a TiN/Hf0. 5Zr0. 5O2 (HZO) gate stack on a
germanium p-type channel are fabricated as low-voltage nonvolatile memory (NVM) …

The effect of donor/acceptor nature of interface traps on Ge MOSFET characteristics

D Kuzum, JH Park, T Krishnamohan… - … on electron devices, 2011 - ieeexplore.ieee.org
In this paper, the acceptor and donor nature of interface traps are investigated using
conductance and interface trap time constant measurements on Ge n-and p-type metal …

Mobility enhancement technology for scaling of CMOS devices: overview and status

Y Song, H Zhou, Q Xu, J Luo, H Yin, J Yan… - Journal of electronic …, 2011 - Springer
The aggressive downscaling of complementary metal–oxide–semiconductor (CMOS)
technology to the sub-21-nm technology node is facing great challenges. Innovative …

Effects of (NH4) 2S passivation on the off-state performance of 3-dimensional InGaAs metal-oxide-semiconductor field-effect transistors

JJ Gu, AT Neal, PD Ye - Applied Physics Letters, 2011 - pubs.aip.org
Planar and 3-dimensional (3D) buried-channel InGaAs metal-oxide-semiconductor field-
effect transistors (MOSFETs) have been experimentally demonstrated at deep-submicron …