GaN: Processing, defects, and devices

SJ Pearton, JC Zolper, RJ Shul, F Ren - Journal of applied physics, 1999 - pubs.aip.org
The role of extended and point defects, and key impurities such as C, O, and H, on the
electrical and optical properties of GaN is reviewed. Recent progress in the development of …

Fabrication and performance of GaN electronic devices

SJ Pearton, F Ren, AP Zhang, KP Lee - Materials Science and Engineering …, 2000 - Elsevier
GaN and related materials (especially AlGaN) have recently attracted a lot of interest for
applications in high power electronics capable of operation at elevated temperatures …

Transient electron transport in wurtzite GaN, InN, and AlN

BE Foutz, SK O'Leary, MS Shur… - Journal of applied …, 1999 - pubs.aip.org
Transient electron transport and velocity overshoot in wurtzite GaN, InN, and AlN are
examined and compared with that which occurs in GaAs. For all materials, we find that …

GaN based transistors for high power applications

MS Shur - Solid-State Electronics, 1998 - Elsevier
Unique properties of GaN and related semiconductors make them superior for high-power
applications. The maximum density of the two-dimensional electron gas at the GaN/AlGaN …

Electron transport in AlGaN–GaN heterostructures grown on 6H–SiC substrates

R Gaska, JW Yang, A Osinsky, Q Chen… - Applied Physics …, 1998 - pubs.aip.org
We investigated two-dimensional electron transport in doped AlGaN–GaN heterostructures
(with the electron sheet concentration ns≈ 10 13 cm− 2) grown on conducting 6H–SiC …

GaN electronics

SJ Pearton, F Ren - Advanced Materials, 2000 - Wiley Online Library
An overview is presented of progress in GaN electronic devices for high‐power, high‐
temperature applications. The wide bandgaps of the nitride materials, their excellent …

Electrical effects of plasma damage in

XA Cao, SJ Pearton, AP Zhang, GT Dang, F Ren… - Applied physics …, 1999 - pubs.aip.org
The reverse breakdown voltage of p-GaN Schottky diodes was used to measure the
electrical effects of high density Ar or H 2 plasma exposure. The near surface of the p-GaN …

High-temperature performance of AlGaN/GaN HFETs on SiC substrates

R Gaska, Q Chen, J Yang, A Osinsky… - IEEE Electron …, 1997 - ieeexplore.ieee.org
The performance results AlGaN-GaN Heterostructure Field Effect Transistors (HFETs) grown
on SiC substrates are reported. The maximum transconductance of these devices was 142 …

DC and microwave performance of high-current AlGaN/GaN heterostructure field effect transistors grown on p-type SiC substrates

AT Ping, Q Chen, JW Yang, MA Khan… - IEEE Electron Device …, 1998 - ieeexplore.ieee.org
The fabrication and characterization of high performance AlGaN/GaN heterostructure field
effect transistors (HFETs) grown on p-type SiC substrates are reported for the first time. The …

High-quality oxide/nitride/oxide gate insulator for GaN MIS structures

B Gaffey, LJ Guido, XW Wang… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
We report on a SiO/sub 2//Si/sub 3/N/sub 4//SiO/sub 2/(ONO) gate insulator stack deposited
on GaN by jet vapor deposition (JVD) technique. Capacitors fabricated using the JVD-ONO …