Optimization of resonant PZT MEMS mirrors by inverse design and electrode segmentation
A Piot, J Pribošek, J Maufay, J Schicker… - Journal of …, 2021 - ieeexplore.ieee.org
This paper presents a systematic approach to transduction optimization of resonant piezo-
based MEMS devices. The method is based on inverse design approach using direct …
based MEMS devices. The method is based on inverse design approach using direct …
Precise Two-Dimensional Tilt Measurement Sensor with Double-Cylindrical Mirror Structure and Modified Mean-Shift Algorithm for a Confocal Microscopy System
Z Wang, T Wang, Y Yang, Y Yang, X Mi, J Wang - Sensors, 2022 - mdpi.com
To improve the accuracy of three-dimensional (3D) surface contour measurements of
freeform optics, a two-dimensional (2D) tilt measurement sensor for confocal microscopy …
freeform optics, a two-dimensional (2D) tilt measurement sensor for confocal microscopy …
Influence of surface tilt angle on a chromatic confocal probe with a femtosecond laser
This paper presents an intentional investigation of the effect of the object tilt angle on the
tracking local minimum method (TL method), which is the one for detecting the measurement …
tracking local minimum method (TL method), which is the one for detecting the measurement …
Design of a confocal dispersion objective lens based on the GRIN lens
C Li, K Li, J Liu, Z Lv, G Li, D Li - Optics Express, 2022 - opg.optica.org
Spectral confocal technology utilizes the principle of dispersion to establish the precise
coding relationship between spatial position and wavelength in the axial focal point. The …
coding relationship between spatial position and wavelength in the axial focal point. The …
A Differential Confocal Sensor for Simultaneous Position and Slope Acquisitions Based on a Zero-Crossing Prediction Algorithm
T Wang, Z Wang, Y Yang, X Mi, Y Ti, J Wang - Sensors, 2023 - mdpi.com
A new sensor type is proposed to accurately detect the surface profiles of three-dimensional
(3D) free-form surfaces. This sensor is based on the single-exposure, zero-crossing method …
(3D) free-form surfaces. This sensor is based on the single-exposure, zero-crossing method …
Precise 3-D microscopic profilometry using diffractive image microscopy and artificial neural network in single-exposure manner
GW Wu, LC Chen - Optics and Lasers in Engineering, 2021 - Elsevier
A single-exposure microscopic profilometry using artificial neural network (ANN) was
developed for 3-D profile reconstruction of precise surface geometry. Optical profilometry is …
developed for 3-D profile reconstruction of precise surface geometry. Optical profilometry is …
Resolving measurement ambiguity in diffractive image microscopy for 6DOF surface measurement using designed aberration and multiple-layer perceptron
GW Wu, LC Chen - The International Journal of Advanced Manufacturing …, 2023 - Springer
The article presents a new method for resolving measurement ambiguity in diffractive image
microscopy (DIM) for automated optical inspection (AOI) in advanced manufacturing. The …
microscopy (DIM) for automated optical inspection (AOI) in advanced manufacturing. The …
基于差动共焦的倾角测量传感器.
王廷煜, 王之一, 杨永强, 糜小涛… - Chinese Journal of …, 2023 - search.ebscohost.com
为了解决传统激光差动共焦显微镜(LDCM) 无法在测距的同时, 进行高精度倾斜角度测量的问题,
提出了一种基于差动共焦的倾角测量传感器. 在对倾斜表面进行测量时, 该传感器首先利用轴向 …
提出了一种基于差动共焦的倾角测量传感器. 在对倾斜表面进行测量时, 该传感器首先利用轴向 …
Investigation and mapping strategy on influence of surface tilting in diffractive pattern correlation profilometry
GW Wu, MJ Jiang, LC Chen - Applied Optical Metrology III, 2019 - spiedigitallibrary.org
A new full-field profilometry based on diffraction image correlation (DIC) was developed in
which the technique bases on calibrated database of reference diffractive images (RDIs) to …
which the technique bases on calibrated database of reference diffractive images (RDIs) to …
Accuracy-enhanced diffraction image profilometry using foreign aberration for resolving image ambiguity
GW Wu, LC Chen - Optics and Photonics for Advanced …, 2022 - spiedigitallibrary.org
A new optical surface measuring method based on correlation-based diffractive image
profilometry (DIP) is developed for accuracy enhancement by introducing external optical …
profilometry (DIP) is developed for accuracy enhancement by introducing external optical …