Recent advances on kinetic analysis of solder joint reactions in 3D IC packaging technology

KN Tu, Y Liu - Materials Science and Engineering: R: Reports, 2019 - Elsevier
We review five solder joint reactions in 3D IC packaging technology which are of wide
interest:(1) Scallop-type growth of Cu 6 Sn 5 in solid-liquid interdiffusion reaction,(2) Whisker …

Growth of whiskers from Sn surfaces: Driving forces and growth mechanisms

E Chason, N Jadhav, F Pei, E Buchovecky… - Progress in Surface …, 2013 - Elsevier
Sn whiskers are thin filaments that grow spontaneously out of the surface of coatings on Cu
and have become a critical reliability problem in Pb-free electronics. In this review, we focus …

Effect of Joule heating and current crowding on electromigration in mobile technology

KN Tu, Y Liu, M Li - Applied Physics Reviews, 2017 - pubs.aip.org
In the present era of big data and internet of things, the use of microelectronic products in all
aspects of our life is manifested by the ubiquitous presence of mobile devices as i-phones …

Transition from flip chip solder joint to 3D IC microbump: Its effect on microstructure anisotropy

KN Tu, HY Hsiao, C Chen - Microelectronics Reliability, 2013 - Elsevier
As microelectronic industry develops 3D IC on the basis of through-Si-vias (TSV)
technology, the processing and reliability of microbumps, which are used to interconnect the …

Annotated tin whisker bibliography and anthology

GT Galyon - IEEE Transactions on Electronics Packaging …, 2005 - ieeexplore.ieee.org
Whisker publications from 1947 through 2004 are summarized and referenced in this
document. The bibliography listings are chronological (by publication year) while the …

Spontaneous whisker growth on lead-free solder finishes

KN Tu, JCM Li - Materials Science and Engineering: A, 2005 - Elsevier
Spontaneous whisker growth on beta-Sn is a creep phenomenon near a surface, driven by
compressive force. The compressive force is self-generated and the sample responses by …

Driving force and mechanism for spontaneous metal whisker formation

MW Barsoum, EN Hoffman, RD Doherty, S Gupta… - Physical Review Letters, 2004 - APS
The room temperature spontaneous growth of low melting point metal whiskers, such as Sn,
poses a serious reliability problem in the semiconducting industry; a problem that has …

Driving force for Sn whisker growth in the system Cu–Sn

M Sobiech, U Welzel, EJ Mittemeijer, W Hügel… - Applied Physics …, 2008 - pubs.aip.org
The evolution of residual stress gradients in Sn thin films on Cu substrates upon aging at
ambient temperature has been investigated, for specimens which do exhibit and which do …

Local, submicron, strain gradients as the cause of Sn whisker growth

M Sobiech, M Wohlschlögel, U Welzel… - Applied Physics …, 2009 - pubs.aip.org
It has been shown experimentally that local in-plane residual strain gradients occur around
the root of spontaneously growing Sn whiskers on the surface of Sn coatings deposited on …

Scanning 3DXRD Measurement of Grain Growth, Stress, and Formation of Cu6Sn5 around a Tin Whisker during Heat Treatment

J Hektor, SA Hall, NA Henningsson, J Engqvist… - Materials, 2019 - mdpi.com
The 3D microstructure around a tin whisker, and its evolution during heat treatment were
studied using scanning 3DXRD. The shape of each grain in the sample was reconstructed …