A Π-shaped p-GaN HEMT for reliable enhancement mode operation

K Sehra, V Kumari, M Gupta, M Mishra… - Microelectronics …, 2022 - Elsevier
This paper presents a TCAD based investigation of virtually fabricated Π-shaped Gate p-
GaN HEMT for reliable enhancement mode operation. A detailed comparison with the …

NiO/AlGaN interface reconstruction and transport manipulation of p-NiO gated AlGaN/GaN HEMTs

H Guo, H Gong, X Yu, R Wang, Q Cai, J Xue… - Applied Physics …, 2021 - pubs.aip.org
Normally off AlGaN/GaN high electron mobility transistors with a p-type gate are promising
for power switching applications, with advantages of low energy consumption and safe …

Two-dimensional polarization doping of GaN heterojunction and its potential for realizing lateral pn junction devices

Z Wang, L Li - Applied Physics A, 2022 - Springer
In the gallium nitride (GaN) commercial applications such as high-power illumination and
portable charging station, bipolar devices are highly demanded because of their superior …

Review on Main Gate Characteristics of P-Type GaN Gate High-Electron-Mobility Transistors

Z Wang, J Nan, Z Tian, P Liu, Y Wu, J Zhang - Micromachines, 2023 - mdpi.com
As wide bandgap semiconductors, gallium nitride (GaN) lateral high-electron-mobility
transistors (HEMTs) possess high breakdown voltage, low resistance and high frequency …

Analysis of energy loss in GaN E-mode devices under UIS stresses

R Sun, J Lai, C Liu, W Chen, Y Chen… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
This article analyzes the energy loss E loss in GaN enhancement-mode (E-mode) devices
under unclamped inductive switching (UIS) stresses. Based on the second-order circuit …

Improving breakdown voltage and threshold voltage stability by clamping channel potential for short-channel power p-GaN HEMTs

H Wang, Y Shi, Y Xin, C Liu, G Lu, Y Huang - Micromachines, 2022 - mdpi.com
This paper proposes a novel p-GaN HEMT (P-HEMT) by clamping channel potential to
improve breakdown voltage (BV) and threshold voltage (V TH) stability. The clamping …

High voltage normally-off p-GaN gate HEMT with the compatible high threshold and drain current

C Yu, F Wang, J He, Y Zhang, R Sun… - ECS Journal of Solid …, 2022 - iopscience.iop.org
In this paper, we demonstrate a high voltage normally-off p-GaN gate high-electron-mobility-
transistor (HEMT) to realize the compatible high threshold voltage (V TH) and high drain …

Simulation study of a high gate-to-source ESD robustness power p-GaN HEMT with self-triggered discharging channel

Y Xin, W Chen, R Sun, F Wang, X Deng… - … on Electron Devices, 2021 - ieeexplore.ieee.org
This article proposes a novel power p-GaN high-electron-mobility transistor (HEMT) with self-
triggered discharging channel to improve gate-to-source electrostatic discharge (ESD) …

Physical Understanding on Short-Circuit Failure for Cascode GaN HEMTs

X Song, J Wang, G Deng, Y Zou… - IEEE Journal of …, 2024 - ieeexplore.ieee.org
Short-circuit (SC) robustness is an important concern for power devices in switching mode
power supplies. For individual transistors such as Si and SiC MOSFETs, the SC capability …

Analytically Modeling the Effect of Buffer Charge on the 2DEG Density in AlGaN/GaN HEMT

F Wang, W Chen, Y Wang, R Sun… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this article, an analytical model of the buffer charge (BC) effect is presented for the 2-D
electron-gas (2DEG) density (prediction in AlGaN/GaN high-electron-mobility-transistor …