For low bit rate speech coding applications, it is important to quantize the LPC parameters
accurately using as few bits as possible. Though vector quantizers are more efficient than …

Today, soft errors are one of the major design technology challenges at and beyond the
22nm technology nodes. This article introduces the soft error problem from the perspective …

Alpha, neutron, and heavy-ion single-event measurements were performed on both high-
performance and hardened flip-flop designs in a 28-nm bulk CMOS technology. The …

Technology Scaling and Soft Error Reliability Page 1 Technology Scaling and Soft Error
Reliability Lloyd W. Massengill Professor, Department of Electrical Engineering and Computer …

Use of a standard non-rad-hard digital cell library in the rad-hard design can be a cost-
effective solution for space applications. In this paper we demonstrate how a standard non …

Deep learning neural network (DNN) accelerators have been increasingly deployed in many
fields recently, including safety-critical applications such as autonomous vehicles and …

Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present the results of a soft error rate (SER) …

Single event upset (SEU) experimental heavy ion data and modeling results for CMOS,
silicon-on-insulator (SOI), 32 nm and 45 nm stacked and DICE latches are presented. Novel …

In this paper, the alpha-particle induced soft error rate of two flip-flops are investigated as a
function of operating frequency between 80 MHz and 1.2 GHz. The two flip-flops-an …

In this paper, the radiation response of a single-event tolerant flip-flop design named the
Quatro flip-flop is presented. Circuit level simulations on the flip-flop design show 1) the …