[PDF][PDF] Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction
U Welzel, J Ligot, P Lamparter… - Journal of Applied …, 2005 - journals.iucr.org
The components of the macroscopic mechanical stress tensor of a stressed thin film, coating,
multilayer or the region near the surface of a bulk material can in principle be determined by …
multilayer or the region near the surface of a bulk material can in principle be determined by …
Shaping the structure and properties of titanium and Ti6Al7Nb titanium alloy in low-temperature plasma nitriding processes
M Tarnowski, T Borowski, S Skrzypek… - Journal of Alloys and …, 2021 - Elsevier
Plasma nitriding of titanium Grade 2 and Ti6Al7Nb titanium alloy at 730° C was used to
produce nitrided surface layers with an outer zone consisting of nanocrystalline titanium …
produce nitrided surface layers with an outer zone consisting of nanocrystalline titanium …
Nanohardness and tribological properties of nc-TiB2 coatings
The work is devoted to the investigation of nanohardness and tribological properties in TiB2
coatings deposited on austenitic steel substrates using an unbalanced magnetron sputtering …
coatings deposited on austenitic steel substrates using an unbalanced magnetron sputtering …
Multi-reflection method and grazing incidence geometry used for stress measurement by X-ray diffraction
A Baczmanski, C Braham, W Seiler, N Shiraki - Surface and Coatings …, 2004 - Elsevier
The X-ray diffraction measurement based on the grazing incidence geometry was applied to
determine lattice strains in polycrystalline materials. The multi-reflection method was used …
determine lattice strains in polycrystalline materials. The multi-reflection method was used …
X-ray texture tomography of near-surface areas
JT Bonarski - Progress in materials science, 2006 - Elsevier
The author's aim was to develop a research tool for non-destructive investigation of space
arrangement of crystallites in the near-surface areas of structural elements and materials of …
arrangement of crystallites in the near-surface areas of structural elements and materials of …
Residual stress determination in thin films by X-ray diffraction and the widespread analytical practice applying a biaxial stress model: An outdated oversimplification?
P Schoderböck, H Köstenbauer - Applied Surface Science, 2021 - Elsevier
Compressive stresses are commonly desired in thin films and the stress state in layers and
coatings is in general evaluated assuming a biaxial nature of stress. But how thin is thick …
coatings is in general evaluated assuming a biaxial nature of stress. But how thin is thick …
Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles
M Marciszko, A Baczmański, C Braham, M Wróbel… - Acta Materialia, 2017 - Elsevier
The presented study introduces the development of the multi-reflection grazing-incidence X-
ray diffraction method (MGIXD) for residual stress determination. The proposed new …
ray diffraction method (MGIXD) for residual stress determination. The proposed new …
The synergetic effect of micro-blasting and thermal oxidation on the corrosion performance of Ti6Al4V
P Jeyalakshmi, P Ramkumar - Surface and Coatings Technology, 2023 - Elsevier
Ti6Al4V alloy is widely used for orthopaedic applications due to its excellent
osteointegration, good biocompatibility, great strength-to-weight ratio, and comparable …
osteointegration, good biocompatibility, great strength-to-weight ratio, and comparable …
Multireflection grazing incidence diffraction used for stress measurements in surface layers
M Marciszko, A Baczmański, M Wrobel, W Seiler… - Thin Solid Films, 2013 - Elsevier
The geometry based on the multireflection grazing incidence X-ray diffraction can be applied
to measure residual stresses. Using this method, it is possible to perform a non-destructive …
to measure residual stresses. Using this method, it is possible to perform a non-destructive …
Residual stress gradient of Cr and CrN thin films
Abstract In this work Cr, CrN thin films were grown by the Magnetron Sputtering technique
on monocrystalline silicon (400) substrates. Also, a (Cr/CrN) 2 multilayer film was grown in …
on monocrystalline silicon (400) substrates. Also, a (Cr/CrN) 2 multilayer film was grown in …