Hierarchical fault diagnosis of analog integrated circuits
CK Ho, PR Shepherd, F Eberhardt… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
This paper introduces a hierarchical-fault-diagnosis algorithm as an aid to testing analog
and mixed signal circuits. The diagnosis approach is based on that introduced by Wey and …
and mixed signal circuits. The diagnosis approach is based on that introduced by Wey and …
Simulation and sensitivity of linear analog circuits under parameter variations by robust interval analysis
CJR Shi, MW Tian - ACM Transactions on Design Automation of …, 1999 - dl.acm.org
An interval-mathematic approach is presented for frequency-domain simulation and
sensitivity analysis of linear analog circuits under parameter variations. With uncertain …
sensitivity analysis of linear analog circuits under parameter variations. With uncertain …
Generation and verification of tests for analog circuits subject to process parameter deviations
SJ Spinks, CD Chalk, IM Bell, M Zwolinski - Journal of Electronic Testing, 2004 - Springer
The paper presents a test stimulus generation and fault simulation methodology for the
detection of catastrophic faults in analog circuits. The test methodology chosen for …
detection of catastrophic faults in analog circuits. The test methodology chosen for …
A design for testability study on a high performance automatic gain control circuit
A Lechner, A Richardson, B Hermes… - … . 16th IEEE VLSI Test …, 1998 - ieeexplore.ieee.org
A comprehensive testability study on a commercial automatic gain control circuit is
presented which aims to identify design for testability (DfT) modifications to both reduce …
presented which aims to identify design for testability (DfT) modifications to both reduce …
[图书][B] Testing a CMOS operational amplifier circuit using a combination of oscillation and IDDQ test methods
PK Alli - 2004 - search.proquest.com
This work presents a case study, which attempts to improve the fault diagnosis and testability
of the oscillation testing methodology applied to a typical two-stage CMOS operational …
of the oscillation testing methodology applied to a typical two-stage CMOS operational …
An I2C based mixed-signal test and measurement infrastructure
AJS Escobar, JM da Silva… - 19th Annual International …, 2014 - ieeexplore.ieee.org
The framework being proposed addresses the test and measurement of circuits and systems
populated with varying types of sensors and functional blocks, among which one can find …
populated with varying types of sensors and functional blocks, among which one can find …
[HTML][HTML] Monitoring and cross-calibration of altimeter σ0 through dual-frequency backscatter measurements
GD Quartly - Journal of Atmospheric and Oceanic Technology, 2000 - journals.ametsoc.org
Monitoring and Cross-Calibration of Altimeter σ0 through Dual-Frequency Backscatter
Measurements in: Journal of Atmospheric and Oceanic Technology Volume 17 Issue 9 (2000) …
Measurements in: Journal of Atmospheric and Oceanic Technology Volume 17 Issue 9 (2000) …
Tolerance maximisation in fault diagnosis of analogue electronic circuits
L Chruszczyk, D Grzechca - 2011 20th European Conference …, 2011 - ieeexplore.ieee.org
This article presents maximisation of components tolerance together with finding optimal
frequency of a periodic excitation in fault diagnosis of analogue electronic circuits …
frequency of a periodic excitation in fault diagnosis of analogue electronic circuits …
[PDF][PDF] Use of artificial intelligence techniques to fault diagnosis in analog systems
J Rutkowski, D Grzechca - Proc. 2nd European Computing …, 2008 - academia.edu
Basic concepts of fault diagnosis in analog and mixed (analog and digital) electronic
systems by means of the simulation-before-test approach, the so called dictionary approach …
systems by means of the simulation-before-test approach, the so called dictionary approach …
[PDF][PDF] A digital partial built-in self-test structure for a high performance automatic gain control circuit
A Lechner, J Ferguson, A Richardson… - Proceedings of the …, 1999 - dl.acm.org
It is now widely recognised that Design-for-Testability and Built-in Self-Test techniques will
be mandatory to meet test and quality specifications in next generation mixed signal …
be mandatory to meet test and quality specifications in next generation mixed signal …