Efficient design-for-test approach for networks-on-chip
To achieve high reliability in on-chip networks, it is necessary to test the network
continuously with Built-in Self-Tests (BIST) so that the faults can be detected quickly and the …
continuously with Built-in Self-Tests (BIST) so that the faults can be detected quickly and the …
Detection and Localization of Channel-Short Faults in Regular On-Chip Interconnection Networks
B Bhowmik - SN Computer Science, 2023 - Springer
With the rapid developments in VLSI technology, the communication channels in networks-
on-chip (NoCs) can place many wires for sustaining high-performance requirements over …
on-chip (NoCs) can place many wires for sustaining high-performance requirements over …
Transient error correction coding scheme for reliable low power data link layer in NoC
M Vinodhini, NS Murty, TK Ramesh - IEEE Access, 2020 - ieeexplore.ieee.org
Ensuring reliable data transmission in multicore System on Chip (SoC), which employs
Network on Chip (NoC), is a challenging task. This task is well addressed by Error …
Network on Chip (NoC), is a challenging task. This task is well addressed by Error …
A low-cost test solution for reliable communication in networks-on-chip
Abstract Networks-on-chip (NoC) provide the communication infrastructure for high-speed
and large-scale computation that integrates several IP-cores on a single die. Faults on …
and large-scale computation that integrates several IP-cores on a single die. Faults on …
A hierarchical and distributed fault tolerant proposal for NoC-based MPSoCs
EW Wächter, V Fochi, F Barreto… - … on Emerging Topics …, 2016 - ieeexplore.ieee.org
Aggressive scaling of CMOS process technology allows the fabrication of highly integrated
chips such as NoC-based MPSoCs. However, fault probability increases when devices' size …
chips such as NoC-based MPSoCs. However, fault probability increases when devices' size …
Generating Storage-Aware Test Sets Targeting Several Fault Models
Reliability of semiconductor devices requires testing of the chips for faults from multiple fault
models. When test generation is used for producing top off tests to detect faults from different …
models. When test generation is used for producing top off tests to detect faults from different …
Butterfly-Fat-Tree topology based fault-tolerant Network-on-Chip design using particle swarm optimisation
PV Bhanu, PV Kulkarni - Journal of Experimental & Theoretical …, 2019 - Taylor & Francis
As the technology is scaling down more number of processing elements are integrated on to
a single chip, namely system-on-chips (SoCs). Using traditional bus architecture in SoCs …
a single chip, namely system-on-chips (SoCs). Using traditional bus architecture in SoCs …
FILA: Fault-model for interconnection links in application-specific network-on-chip design
In the nano-scale era, to improve the system reliability the major challenge is to predict the
NoC component failures in runtime and propose an efficient technique. To predict the …
NoC component failures in runtime and propose an efficient technique. To predict the …
Adaptive Time-Triggered Network-on-Chip Architecture: Enhancing Safety
R Nambinina, V Wiese, P Muoka… - … on Smart Generation …, 2023 - ieeexplore.ieee.org
Real-time computing systems are designed to meet strict timing constraints and respond to
events or inputs within specific deadlines. These systems are commonly used in safety …
events or inputs within specific deadlines. These systems are commonly used in safety …
Optimizing the location of ECC protection in network-on-chip
The communication in Network-on-Chips (NoCs) may be subject to errors. Error Correcting
Codes (ECCs) can be used to tolerate the transient faults in flits caused by Single Event …
Codes (ECCs) can be used to tolerate the transient faults in flits caused by Single Event …