Plasma cryogenic etching of silicon: from the early days to today's advanced technologies

R Dussart, T Tillocher, P Lefaucheux… - Journal of Physics D …, 2014 - iopscience.iop.org
The evolution of silicon cryoetching is reported in this topical review, from its very first
introduction by a Japanese team to today's advanced technologies. The main advances in …

Method for depositing a planarization layer using polymerization chemical vapor deposition

J Faguet, BA Altemus, K Ichiki - US Patent 10,115,586, 2018 - Google Patents
A method is provided for depositing a planarization layer over features on a substrate using
sequential polymerization chemical vapor deposition. According to one embodiment, the …

Plasma processing of low-k dielectrics

MR Baklanov, JF de Marneffe, D Shamiryan… - Journal of Applied …, 2013 - pubs.aip.org
This paper presents an in-depth overview of the present status and novel developments in
the field of plasma processing of low dielectric constant (low-k) materials developed for …

[HTML][HTML] Comprehensive Review on the Impact of Chemical Composition, Plasma Treatment, and Vacuum Ultraviolet (VUV) Irradiation on the Electrical Properties of …

MR Baklanov, AA Gismatulin, S Naumov, TV Perevalov… - Polymers, 2024 - mdpi.com
Organosilicate glass (OSG) films are a critical component in modern electronic devices, with
their electrical properties playing a crucial role in device performance. This comprehensive …

[PDF][PDF] Advanced interconnects: materials, processing, and reliability

MR Baklanov, C Adelmann, L Zhao… - ECS Journal of Solid …, 2015 - lirias.kuleuven.be
Advanced Interconnects: Materials, Processing, and Reliability Page 1 ECS Journal of Solid State
Science and Technology, 4 (1) Y1-Y4 (2015) Y1 JSS Focus Issue ON Advanced Interconnects …

Impact of VUV photons on SiO2 and organosilicate low-k dielectrics: General behavior, practical applications, and atomic models

MR Baklanov, V Jousseaume, TV Rakhimova… - Applied Physics …, 2019 - pubs.aip.org
This paper presents an in-depth overview of the application and impact of UV/VUV light in
advanced interconnect technology. UV light application in BEOL historically was mainly …

Fundamental limits of material toughening in molecularly confined polymers

SG Isaacson, K Lionti, W Volksen, TP Magbitang… - Nature materials, 2016 - nature.com
The exceptional mechanical properties of polymer nanocomposites are achieved through
intimate mixing of the polymer and inorganic phases, which leads to spatial confinement of …

Porosity scaling strategies for low-k films

DJ Michalak, JM Blackwell, JM Torres… - Journal of Materials …, 2015 - cambridge.org
Reducing the delay of backend interconnects is critical in delivering improved performance
in next generation computer chips. One option is to implement interlayer dielectric (ILD) …

Influence of network bond percolation on the thermal, mechanical, electrical and optical properties of high and low-k a-SiC: H thin films

SW King, J Bielefeld, G Xu, WA Lanford… - Journal of non …, 2013 - Elsevier
As demand for lower power and higher performance nano-electronic products increases, the
semiconductor industry must adopt insulating materials with progressively lower dielectric …

Toward successful integration of porous low-k materials: Strategies addressing plasma damage

K Lionti, W Volksen, T Magbitang… - ECS Journal of Solid …, 2014 - iopscience.iop.org
The increasing sensitivity of porous low dielectric constant materials to process damage
constitutes a major roadblock to their implementation in back-end-of-the-line (BEOL) wiring …