Field programmable gate array (FPGA) devices are increasingly being deployed in industrial
environments, making reconfigurable hardware testing and reliability an active area of …

This paper presents a memristor-based Look-Up Table (LUT) for FPGAs. The proposed
memory utilizes memristors as storage elements and NMOS transistors for selection. New …

FPGA-based emulation of permanent faults in ASICs can considerably improve the fault
simulation time compared to traditional software-based approaches. Moreover, a hardware …

Design disjunction is developed to offer a broad coverage, high resolution, and low
overhead approach to online diagnosis and recovery of reconfigurable fabrics. Design …

In high-speed Nano-scale VLSI designs, memory plays a vital role of operation. Built-In Self-
Test (BIST) for memory is an essential element of the system-on-chip (SoC). Investigating …

In the ongoing high-speed, high-tech sophistication in the technology of VLSI designs, Built-
in Self-Test (BIST) is emerging as the essential element of the memory, which can be treated …

The extensive application of field-programmable gate array (FPGA) devices in industrial
environments makes FPGA testing a significant area of exploration. The application …

This paper presents a new method for application-dependent testing of SRAM-based FPGA
interconnects at run time. This method utilizes new features related to the function for the …

This paper presents a new method for diagnosing (detection and location) multiple faults in
an application-dependent interconnect of a SRAM-based FPGA. For fault detection, the …

As the size and density of silicon chips continue to increase, maintaining acceptable
manufacturing yields has become increasingly difficult. Recent works suggest that …