Tin-based group IV semiconductors: New platforms for opto-and microelectronics on silicon
J Kouvetakis, J Menendez… - Annu. Rev. Mater …, 2006 - annualreviews.org
▪ Abstract New classes of Sn-containing group IV semiconductors are described. Novel CVD
routes lead to growth of a broad range of Ge1− y Sn y alloys and compounds directly on Si …
routes lead to growth of a broad range of Ge1− y Sn y alloys and compounds directly on Si …
Optical critical points of thin-film alloys: A comparative study
The E 0, E 0+ Δ 0, E 1, E 1+ Δ 1, E 0′, and E 2 optical transitions have been measured in
Ge 1− y Sn y alloys (y< 0.2) using spectroscopic ellipsometry and photoreflectance. The …
Ge 1− y Sn y alloys (y< 0.2) using spectroscopic ellipsometry and photoreflectance. The …
Synthesis of ternary SiGeSn semiconductors on Si(100) via buffer layers
M Bauer, C Ritter, PA Crozier, J Ren… - Applied physics …, 2003 - pubs.aip.org
Single-phase Si 1− x− y Ge x Sn y alloys with random diamond cubic structures are created
on Si (100) via ultrahigh vacuum chemical vapor deposition reactions of SnD 4 with SiH 3 …
on Si (100) via ultrahigh vacuum chemical vapor deposition reactions of SnD 4 with SiH 3 …
Relaxed and strained patterned germanium-tin structures: a Raman scattering study
We report the first realization of fully-released and relaxed Ge 1-x Sn x structures on Ge
substrate. The coefficients of Raman peak shift a and b due to the alloy disorder and strain …
substrate. The coefficients of Raman peak shift a and b due to the alloy disorder and strain …
Compositional dependence of Raman frequencies in ternary alloys
VR D'Costa, J Tolle, CD Poweleit, J Kouvetakis… - Physical Review B …, 2007 - APS
The Ge-Ge, Si-Si, and Si-Ge Raman frequencies in Ge 1− x− y Si x Sn y alloys were
measured for x⩽ 0.2 and y⩽ 0.1. The Ge-Ge and Si-Si mode frequencies are found to be …
measured for x⩽ 0.2 and y⩽ 0.1. The Ge-Ge and Si-Si mode frequencies are found to be …
Scaling law for the compositional dependence of Raman frequencies in SnGe and GeSi alloys
The compositional dependence of the Ge–Ge Raman mode in SnGe alloys has been
measured in samples grown on Si substrates using a chemical vapor deposition technique …
measured in samples grown on Si substrates using a chemical vapor deposition technique …
Development of interatomic potential of Ge (1− x− y) SixSny ternary alloy semiconductors for classical lattice dynamics simulation
M Tomita, M Ogasawara, T Terada… - Japanese journal of …, 2018 - iopscience.iop.org
We provide the parameters of Stillinger–Weber potentials for GeSiSn ternary mixed systems.
These parameters can be used in molecular dynamics (MD) simulations to reproduce …
These parameters can be used in molecular dynamics (MD) simulations to reproduce …
Simulations of carbon containing semiconductor alloys: bonding, strain compensation, and surface structure
PC Kelires - International Journal of Modern Physics C, 1998 - World Scientific
This paper reviews recent Monte Carlo simulations within the empirical potential approach,
which give insights into fundamental aspects of the bulk and surface structure of group-IV …
which give insights into fundamental aspects of the bulk and surface structure of group-IV …
Raman spectroscopy and scanning electron microscopy investigation of annealed amorphous carbon–germanium films deposited by dc magnetron sputtering
The precipitation of germanium nanocrystals in amorphous carbon–germanium films allows
for the development of innovative devices, but the accurate control of both size and size …
for the development of innovative devices, but the accurate control of both size and size …
Growth conditions for complete substitutional carbon incorporation into Si1− yCy layers grown by molecular beam epitaxy
S Zerlauth, H Seyringer, C Penn, F Schäffler - Applied physics letters, 1997 - pubs.aip.org
To study the conditions for substitutional incorporation of carbon into Si layers, we grew
pseudomorphic Si1yCy/Si superlattices with absolute carbon concentrations between 0.3 …
pseudomorphic Si1yCy/Si superlattices with absolute carbon concentrations between 0.3 …