On improving the uniqueness of silicon-based physically unclonable functions via optical proximity correction

D Forte, A Srivastava - Proceedings of the 49th Annual Design …, 2012 - dl.acm.org
Physically Unclonable Functions (PUFs) are effective for security applications because they
generate unique signatures that are resistant to cloning attempts as well as physical …

Manipulating manufacturing variations for better silicon-based physically unclonable functions

D Forte, A Srivastava - 2012 IEEE Computer Society Annual …, 2012 - ieeexplore.ieee.org
Physically Unclonable Functions (PUFs) provide interesting solutions to tnany security
related issues. For instance, silicon-based PUFs are novel circuits that exploit manufacturing …

[图书][B] Design and analysis of robust variability-aware SRAM to predict optimal access-time to achieve yield enhancement in future nano-scaled CMOS

J Samandari-Rad - 2012 - search.proquest.com
Abstract Design variability due to inter-die (D2D) and intra-die (WID) process variations has
the potential to significantly reduce the maximum operating frequency and the effective yield …

Improving the quality of delay-based PUFs via optical proximity correction

D Forte, A Srivastava - … on Computer-Aided Design of Integrated …, 2013 - ieeexplore.ieee.org
Silicon physically unclonable functions (PUFs) are circuits that exploit modern
manufacturing variations to generate unique signatures for chip authentication and …

[图书][B] Manufacturing-aware physical design techniques

P Sharma - 2007 - search.proquest.com
CMOS scaling has outpaced manufacturing technology advancements, and consequently
process variability continues to increase. Manufacturing non-idealities induce variations in …

Design Techniques for Lithography-Friendly Nanometer CMOS Integrated Circuits

A Hamouda - 2015 - uwspace.uwaterloo.ca
The Integrated Circuits industry has been a major driver of the outstanding changes and
improvements in the modern day technology and life style that we are observing in our day …

DFM Techniques for the Detection and Mitigation of Hotspots in Nanometer Technology

K Madkour - 2015 - uwspace.uwaterloo.ca
With the continuous scaling down of dimensions in advanced technology nodes, process
variations are getting worse for each new node. Process variations have a large influence …

[图书][B] Mitigation of Variability and Reliability Margins in IC Implementation

TB Chan - 2014 - search.proquest.com
In the late-CMOS era, system-on-chip design and manufacturing margins continue to
increase in light of process variability, circuit reliability and wide operating conditions …

Design, fabrication, and run-time strategies for hardware-assisted security

DJ Forte - 2013 - search.proquest.com
Today, electronic computing devices are critically involved in our daily lives, basic
infrastructure, and national defense systems. With the growing number of threats against …

[PDF][PDF] Modelling of Guardband Reduction on Design Area

N Jin - nanocad.ee.ucla.edu
Considering fabrication variations, timing guardband is introduced to ensure design
reliability. However, trade-off exists between guardband and design performance, especially …