Investigation of junctionless fin-FET characterization in deep cryogenic temperature: DC and RF analysis

D Madadi - IEEE Access, 2022 - ieeexplore.ieee.org
This work presents the SOI Junctionless Fin-FET characterization in Deep Cryogenic
behavior (DC-JLFET). Results show that the JLT device is well-suited for various operations …

Junction-less SOI FET with an Embedded p+ Layer: Investigation of DC, RF, and Negative Capacitance Characteristics

D Madadi, S Mohammadi - Silicon, 2023 - Springer
This paper presents a Junction-less SOI FET with an embedded p+ layer (EP-JLFET) to
obtain extensive volume depletion in 14 nm channel length of the device. The p+ embedded …

Investigating the doping effect of molybdenum oxide on a p-type organic thin-film transistor and their application to unipolar circuits

Y Jeon, YJ Shin, Y Jeon, H Yoo - Organic Electronics, 2023 - Elsevier
This study focuses on investigating the doping effect of molybdenum oxide (MoO X) on a p-
type organic dinaphtho [2, 3-b: 2′, 3′-f] thieno [3, 2-b] thiophene (DNTT) thin-film transistor …

Pyramid P+ area in SOI junction-less MOSFET for logic applications: DC investigation

M Bolokian, AA Orouji, A Abbasi, M Houshmand - Applied Nanoscience, 2023 - Springer
This work presents silicon-on-insulator (SOI) junction-less FETs (C-JLFET) with a pyramid
P+ area within the buried oxide region (PP-JLFET). The Silvaco software analysis shows …

Proposal for variability-induced effective radius of elliptical gate-all-around junctionless transistors and its applicability in hydrogen gas sensors

P Sharma, S Kumar, P Kumar - AEU-International Journal of Electronics …, 2024 - Elsevier
Nano-ribbons with gate-all-around (GAA) architecture have been predicted to serve as next-
generation on-chip transistors, among which, the junctionless transistor (JLT) has emerged …

Linearity and Intermodulation Distortion Analysis of Single and Dual Metal Gate Junctionless Transistor

B Awadhiya, R Ratnakumar, S Kumar, S Yadav… - Heliyon, 2024 - cell.com
Linearity and intermodulation distortion are very crucial parameters for RFICs design.
Therefore, in this work, a detailed comparative analysis on linearity and intermodulation …

Performance improvement of junctionless SOI-MOSFETs by a superior depletion technique

KM Abrishami, AA Orouji, D Madadi - Physica Scripta, 2023 - iopscience.iop.org
This work uses a superior depletion technique to present a junctionless silicon-on-insulator
(SOI) metal-oxide field-effect transistor (MOSFET) in a 14 nm regime. The suggested …

Synergic Effect of Misaligned Gate and Temperature on Hetero‐Dielectric Double‐Gate Junctionless Metal–Oxide‐Semiconductor Field‐Effect Transistors for High …

J Singh, RK Chauhan - physica status solidi (a), 2023 - Wiley Online Library
Junctionless metal–oxide‐semiconductor field‐effect transistors (MOSFETs) have emerged
as a promising alternative to conventional MOSFETs, offering simplified fabrication and …

Analysis of GAA Junction less NS FET towards Analog and RF Applications at 30 nm Regime

AK Panigrahy, S Hanumanthakari… - IEEE Open Journal …, 2024 - ieeexplore.ieee.org
This research focuses on a quantum model created using an entirely novel nanosheet FET.
The standard model describes the performance of a Gate-all-around (GAA) Junction-less …

Complete depletion area in SOI junctionless FETs by multiple buried P-type pockets

M Bolokian, AA Orouji, A Abbasi… - The European Physical …, 2023 - Springer
This paper describes a unique approach for calculating the complete depletion area in
silicon-on-insulator (SOI) junctionless FETs (JL-FET). The suggested approach significantly …