Grazing incidence X-ray techniques are now widely used for surface and thin film analysis.
The present article overviews the recent advancement since 1993 of the grazing incidence X …

The scales involved in modern semiconductor manufacturing and microelectronics continue
to plunge downward. Effective and accurate characterization of materials with thicknesses …

Specular X-ray reflectivity data provide detailed information on the electron density
distribution at an interface. Typical modeling methods involve choosing a generic electron …

Scientific and technological progress depend substantially on the ability to image on the
nanoscale. In order to investigate complex, functional, nanoscopic structures like, eg …

Thin films of near-infrared (NIR)-transparent and highly conductive Mo-doped In 2 O 3 (IMO)
were prepared as transparent electrodes in thin-film photovoltaic cells and energy-efficient …

Fine structure features of energy‐dependent atomic scattering factor near the atomic
absorption edge, are used for structural analysis of low‐Z containing thin film structures. The …

Amorphous, crystallized, and Mg-doped β-Ga 2 O 3 thin films are investigated to understand
the evolution of electronic states and the related atomic arrangement. In the process from the …

For many years, it has been believed that self-organized periodic ring structures known by
the name of Liesegang patterns (LPs) are formed only in quite thick media, typically thicker …

The present paper discusses the feasibility of frequency analysis of X-ray reflectivity data,
which have been used extensively to obtain information on density, layer thickness, surface …

The present invention relates to the calibration and align ment of an X—ray re? ectometry
(“XRR”) system for mea suring thin? lms. An aspect of the present invention describes a …