Wide-bandgap power semiconductors for electric vehicle systems: Challenges and trends

T Van Do, JPF Trovão, K Li… - IEEE Vehicular …, 2021 - ieeexplore.ieee.org
In recent years, researchers have been attracted to the application of wide-bandgap (WBG)
power semiconductor devices such as silicon carbide (SiC) and gallium nitride (GaN) in …

A Fast and Accurate GaN Power Transistor Model and Its Application for Electric Vehicle

K Li, S Sen - IEEE Transactions on Vehicular Technology, 2023 - ieeexplore.ieee.org
In order to overcome the challenge of balancing accuracy with simulation speed of power
electronics converters for system-level simulation, the paper proposes a GaN power …

Modelling GaN-HEMT dynamic on-state resistance in high frequency power converter

K Li, A Videt, N Idir, P Evans… - 2020 IEEE Applied …, 2020 - ieeexplore.ieee.org
In order to model GaN device dynamic R DSon value due to trapped charge, a
measurement circuit to accurately measure device dynamic R DSon value under different …

Reviewing of using wide-bandgap power semiconductor devices in electric vehicle systems: From component to system

TV Do, K Li, JP Trovão, L Boulon - 2020 IEEE Vehicle Power …, 2020 - ieeexplore.ieee.org
The application of wide-bandgap (WBG) power semiconductor devices (silicon carbide and
gallium nitride) in EV power electronics systems has a huge potential to increase EV …

Analysis of GaN converter circuit stability influenced by current collapse effect

A Videt, K Li, N Idir, P Evans… - 2020 IEEE Applied …, 2020 - ieeexplore.ieee.org
GaN transistors allow to design highly efficient and high power density converters due to
their low conduction and switching losses. However, their very fast switching and low gate …

Investigation on Single and Split Output Gate Configurations Influence on the GaN-HEMTs Switching Behaviours

X Lu, A Videt, N Idir, V Marsic, P Igic… - 2023 25th European …, 2023 - ieeexplore.ieee.org
This work investigates the power GaN-HEMTs switching behaviour differences resulted from
usage of two gate driving configurations: single and split outputs. The analysis based on …

A Flexible Setup for Dynamic On-State Resistance Measurements of GaN HEMTs With One-Factor-at-a-Time Capability

MCJ Weiser, V Köhnlein… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
A measurement circuit for the characterization of trapping effects in GaN HEMTs is
presented. The circuit is based on the operating principle of separating the high-voltage …

Current Collapse Conduction Losses Minimization in GaN Based PMSM Drive

P Skarolek, O Lipcak, J Lettl - Electronics, 2022 - mdpi.com
The ever-increasing demands on the efficiency and power density of power electronics
converters lead to the replacement of traditional silicon-based components with new …

Impact of Instability of Schottky-type p-GaN Gate HEMTs on Switching Behaviors

X Lu, A Videt, S Faramehr, K Li… - … on Power Electronics, 2024 - ieeexplore.ieee.org
Schottky-type p-GaN gate Gallium Nitride High Electron Mobility Transistors (GaN-HEMTs)
suffer from threshold voltage () instability phenomenon. Both positive and negative shifts are …

Influence of Current Collapse due to Bias Effect on GaN-HEMTs Characteristics in Saturation Region

X Lu, A Videt, K Li, S Faramehr, P Igic… - 2022 24th European …, 2022 - ieeexplore.ieee.org
A new method is proposed in this paper to investigate the influence of current collapse effect
on the I_d-V_ds characteristics of GaN-HEMTs in high voltage region based on a modified H …