Selective area regrowth and doping for vertical gallium nitride power devices: Materials challenges and recent progress

H Fu, K Fu, C Yang, H Liu, KA Hatch, P Peri… - Materials Today, 2021 - Elsevier
This paper reviews materials challenges and recent progress for selective area regrowth
and doping for vertical gallium nitride (GaN) power devices. The purpose is to realize …

Selective area doping of GaN toward high-power applications

RA Ferreyra, B Li, S Wang, J Han - Journal of Physics D: Applied …, 2023 - iopscience.iop.org
Selective area doping in GaN, especially p-type, is a critical and inevitable building block for
the realization of advanced device structures for high-power applications, including, but not …

Vertical GaN power devices: Device principles and fabrication technologies—Part II

H Fu, K Fu, S Chowdhury, T Palacios… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Vertical gallium nitride (GaN) power devices are enabling next-generation power electronic
devices and systems with higher energy efficiency, higher power density, faster switching …

Unveiling the influence of selective-area-regrowth interfaces on local electronic properties of GaN pn junctions for efficient power devices

AS Chang, B Li, S Wang, S Frisone, RS Goldman… - Nano Energy, 2022 - Elsevier
We report correlated nanoscale mapping of the structure, composition, and properties of
regrown GaN pn junctions to identify how etching and non-planar regrowth processes limit …

AlN/GaN HEMTs with fmax Exceeding 300 GHz by Using Ge-Doped n++GaN Ohmic Contacts

L Yang, W Huang, D Wang, B Zhang… - ACS Applied …, 2023 - ACS Publications
Here, we report a high-performance AlN/GaN high electron mobility transistor (HEMT) by
using a heavily Ge-doped regrown GaN source and drain. We demonstrated that the …

[HTML][HTML] Isotropic atomic layer etching of GaN using SF6 plasma and Al (CH3) 3

NJ Chittock, Y Shu, SD Elliott, H Knoops… - Journal of Applied …, 2023 - pubs.aip.org
GaN is an enabling material for light emitting diodes, advanced radio frequency, and power
semiconductor devices. However, fabrication of GaN devices often relies on harsh etch …

Selective area regrowth produces nonuniform Mg doping profiles in nonplanar GaN p–n junctions

AS Chang, B Li, S Wang, M Nami… - ACS Applied …, 2021 - ACS Publications
Nonplanar GaN p–n junctions formed by selective area regrowth were analyzed using
pulsed laser atom probe tomography. Dilute Al marker layers were used to map the …

Etched-and-regrown GaN P–N diodes with low-defect interfaces prepared by in situ TBCl etching

B Li, S Wang, M Nami, AM Armstrong… - ACS Applied Materials & …, 2021 - ACS Publications
The ability to form pristine interfaces after etching and regrowth of GaN is a prerequisite for
epitaxial selective area doping, which in turn is needed for the formation of lateral PN …

Strain mapping of GaN substrates and epitaxial layers used for power electronic devices by synchrotron X-ray rocking curve topography

Y Liu, Z Chen, S Hu, H Peng, Q Cheng… - Journal of Crystal …, 2022 - Elsevier
Strain and tilt maps of gallium nitride (GaN) materials including substrates, ion-implanted
and annealed epilayers, and etched and regrown epilayers by different etching methods …

A study of damage-free in-situ etching of GaN in metalorganic chemical vapor deposition (MOCVD) by tertiarybutylchloride (TBCl)

B Li, S Wang, M Nami, J Han - Journal of Crystal Growth, 2020 - Elsevier
This paper reports a study of the effect of NH 3 flow rate and reactor temperature on the
tertiarybutylchloride (TBCl) etching of patterned GaN-on-sapphire templates. It is found that …