A universal block of series-connected SiC MOSFETs using current-source gate driver
SiC MOSFET has superior switching performance over Si IGBT in terms of power loss and
temperature characteristics. In order to significantly improve the efficiency and power density …
temperature characteristics. In order to significantly improve the efficiency and power density …
Investigation of low-profile, high-performance 62-mm SiC power module package
J Ke, S Huang, Z Yuan, Z Zhao, X Cui… - IEEE Journal of …, 2020 - ieeexplore.ieee.org
Silicon carbide (SiC) power devices possess many beneficial properties for power
electronics applications, but commercial 62-mm SiC power module packages with the direct …
electronics applications, but commercial 62-mm SiC power module packages with the direct …
An analytical SiC MOSFET switching behavior model considering parasitic inductance and temperature effect
This paper presents an improved model to demonstrate the effect of parasitic inductance
and temperature on switching behavior of silicon carbide MOSFET to offer a reference on …
and temperature on switching behavior of silicon carbide MOSFET to offer a reference on …
Analytic modeling of a hybrid power module based on diamond and SiC devices
M Couret, A Castelan, N Donato, F Udrea… - Diamond and Related …, 2022 - Elsevier
Unlike SiC unipolar devices, the on-state resistance of diamond unipolar devices based on
bulk conduction has a negative temperature coefficient (NTC) which reduces the conduction …
bulk conduction has a negative temperature coefficient (NTC) which reduces the conduction …
Optimisation of High Reliability Integrated Motor Drives
H Calder - 2023 - etheses.dur.ac.uk
The development of integrated motor drives (IMDs) with high volumetric power density and
reliability are crucial for the continued development and adoption of electric vehicles (EV) …
reliability are crucial for the continued development and adoption of electric vehicles (EV) …
Extraction of Junction Temperature of SiC MOSFET Module Based on Turn-On dIDS/dt
D Huang, G Tan, C Geng, J Zhang, C Liu - Energies, 2018 - mdpi.com
In this paper, a method of extracting the junction temperature based on the turn-on current
switching rate (dIDS/dt) of silicon carbide (SiC) metal-oxide semiconductor field effect …
switching rate (dIDS/dt) of silicon carbide (SiC) metal-oxide semiconductor field effect …
An improved active gate drive method for SiC MOSFET better switching performance
C Xu, Q Ma, P Xu, T Cui, P Zhang - 2018 IEEE 3rd Advanced …, 2018 - ieeexplore.ieee.org
This paper proposes an improved new SiC MOSFET gate drive method to reduce
overshoots in current and voltage, EMI (electromagnetic interference), and switching …
overshoots in current and voltage, EMI (electromagnetic interference), and switching …
Exploring the Performance Impacts of Harmful FPGA Configurations
T Gaskin - 2021 - search.proquest.com
In this work a new technique for accelerating the aging of FPGA devices is proposed and
demonstrated. The proposed technique uses harmful configurations (short circuits) to …
demonstrated. The proposed technique uses harmful configurations (short circuits) to …