Ever increasing demands of data traffic makes the transition to 6G communications in the
300 GHz band inevitable. Short-channel field-effect transistors (FETs) have demonstrated …

Abstract Three-dimensional (3D) semiconductor packaging has the potential to overcome
Moore's Law for future integrated circuits (ICs), but the inspection and testing of 3D ICs to …

We developed a theory of collective plasma oscillations in a dc current-biased field effect
transistor with an interdigitated dual grating gate and demonstrated a new mechanism of …

Multi-layer lightweight composite structures are widely used in the field of aviation and
aerospace during the processes of manufacturing and use, and, as such, they inevitably …

Counterfeit electronics parts have changed today's electronic market all over the world. A
large number of Integrated Circuit (IC) designers, manufacturers and suppliers present in the …

THz testing has been recently proposed to identify altered or damaged ICs. This method is
based on the fact that a modern field-effect transistor (FET) with a sufficiently short channel …

This work provides a nondestructive terahertz testing technique for the detection of
counterfeit, damaged, or faulty ICs by measuring the response to incident terahertz or …

VLSI (Very Large-Scale Integration) testing is a crucial step in ensuring the reliability and
functionality of integrated circuits. However, conventional testing methods often lack the …

Technical advancement is required to attain a high data transmission rate, which entails
expanding beyond the currently available bandwidth and establishing a new standard for …

With the booming development of computer technology, based on the underlying cloud
computing technology, big data analysis factors of rapid growth also drives the progress of …