This paper reviews the role of expert judgement to support reliability assessments within the
systems engineering design process. Generic design processes are described to give the …

Currently, reliability issues are not addressed effectively in the development of new
products, especially in the early stages of this process. Product reliability depends both on …

Tunnel field-effect transistors (TFETs) have extremely low leakage current, exhibit excellent
subthreshold swing, and are less susceptible to short-channel effects. However, TFETs do …

The advent of the ULSI era, and the continuing decrease of the critical dimensions of
MOSFETs, has raised a number of issues concerning the prediction of device reliability, and …

Modern electronics typically consist of microprocessors and other complex integrated
circuits (ICs) such as FPGAs, ADCs, and memory. They are susceptible to electrical …

Microelectronics device reliability has been improving with every generation of technology
whereas the density of the circuits continues to double approximately every 18 months. We …

Testing has typically been a key means of detecting anomalous performance and of
providing a foundation for estimating reliability for weapon systems. The objective of model …

This paper presents a complete quantitative model to estimate the potential benefits of
simulation-based projects over the conventional approach. In the semiconductor industry …

In this study, the RF and stability aspects of SiGe source-based epitaxial layer tunnel field-
effect transistor (SiGe source ETLTFET) are explored by extracting the capacitances, cutoff …

La complexité des microsystèmes, leur multidisciplinarité, l'hétérogénéité des matériaux
utilisés et les interfaces avec l'environnement extérieur rendent difficiles l'évaluation et la …